References

Module: Characterisation Methodology Ontology

Classes

ACVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ACVoltammetry
Annotations
Preflabel	ACVoltammetry
Elucidation	voltammetry in which a sinusoidal alternating potential of small amplitude (10 to 50 mV) of constant frequency (10 Hz to 100 kHz) is superimposed on a slowly and linearly varying potential ramp
Comment	The resulting alternating current is plotted versus imposed DC potential. The obtained AC voltammogram is peak-shaped.
Comment	voltammetry in which a sinusoidal alternating potential of small amplitude (10 to 50 mV) of constant frequency (10 Hz to 100 kHz) is superimposed on a slowly and linearly varying potential ramp
Comment
Altlabel	ACV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q120895154
Label	ACVoltammetry
Formal description
Subclass Of	Voltammetry

AbrasiveStrippingVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AbrasiveStrippingVoltammetry
Annotations
Preflabel	AbrasiveStrippingVoltammetry
Elucidation	electrochemical method where traces of solid particles are abrasively transferred onto the surface of an electrode, followed by an electrochemical dissolution (anodic or cathodic dissolution) that is recorded as a current–voltage curve
Comment	electrochemical method where traces of solid particles are abrasively transferred onto the surface of an electrode, followed by an electrochemical dissolution (anodic or cathodic dissolution) that is recorded as a current–voltage curve
Comment
Label	AbrasiveStrippingVoltammetry
Formal description
Subclass Of	Voltammetry

AccessConditions

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AccessConditions
Annotations
Preflabel	AccessConditions
Elucidation	Describes what is needed to repeat the experiment
Comment	Describes what is needed to repeat the experiment
Example	In case of national or international facilities such as synchrotrons describe the programme that enabled you to access these. Was the access to your characterisation tool an inhouse routine or required a 3rd party service? Was the access to your sample preparation an inhouse routine or required a 3rd party service?
Label	AccessConditions
Formal description
Subclass Of	NominalProperty

AdsorptiveStrippingVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AdsorptiveStrippingVoltammetry
Annotations
Preflabel	AdsorptiveStrippingVoltammetry
Elucidation	Stripping voltammetry involving pre-concentration by adsorption of the analyte (in contrast to electro-chemical accumulation).
Comment	A peak-shaped adsorptive stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution. AdSV is usually employed for analysis of organic compounds or metal complexes with organic ligands. Stripping is done by means of an anodic or a cathodic voltammetric scan (linear or pulse), during which the adsorbed compound is oxidized or reduced.
Comment	Stripping voltammetry involving pre-concentration by adsorption of the analyte (in contrast to electro-chemical accumulation).
Altlabel	AdSV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	AdsorptiveStrippingVoltammetry
Formal description
Subclass Of	StrippingVoltammetry

AlphaSpectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AlphaSpectrometry
Annotations
Preflabel	AlphaSpectrometry
Elucidation	Alpha spectrometry (also known as alpha(-particle) spectroscopy) is the quantitative study of the energy of alpha particles emitted by a radioactive nuclide that is an alpha emitter. As emitted alpha particles are mono-energetic (i.e. not emitted with a spectrum of energies, such as beta decay) with energies often distinct to the decay they can be used to identify which radionuclide they originated from.
Comment	Alpha spectrometry (also known as alpha(-particle) spectroscopy) is the quantitative study of the energy of alpha particles emitted by a radioactive nuclide that is an alpha emitter. As emitted alpha particles are mono-energetic (i.e. not emitted with a spectrum of energies, such as beta decay) with energies often distinct to the decay they can be used to identify which radionuclide they originated from.
Label	AlphaSpectrometry
Formal description
Subclass Of	Spectrometry

Amperometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Amperometry
Annotations
Preflabel	Amperometry
Elucidation	The amperometric method provides the ability to distinguish selectively between a number of electroactive species in solution by judicious selection of the applied potential and/or choice of electrode material.
Comment	Amperometry can be distinguished from voltammetry by the parameter being controlled (electrode potential E) and the parameter being measured (electrode current I which is usually a function of time – see chronoamperometry). In a non-stirred solution, a diffusion-limited current is usually measured, which is propor-tional to the concentration of an electroactive analyte. The current is usually faradaic and the applied potential is usually constant. The integral of current with time is the electric charge, which may be related to the amount of substance reacted by Faraday’s laws of electrolysis.
Comment	The amperometric method provides the ability to distinguish selectively between a number of electroactive species in solution by judicious selection of the applied potential and/or choice of electrode material.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	Amperometry
Formal description
Subclass Of	ElectrochemicalTesting

AnalyticalElectronMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AnalyticalElectronMicroscopy
Annotations
Preflabel	AnalyticalElectronMicroscopy
Elucidation	Analytical electron microscopy (AEM) refers to the collection of spectroscopic data in TEM or STEM, enabling qualitative or quantitative compositional analysis.
Comment	Analytical electron microscopy (AEM) refers to the collection of spectroscopic data in TEM or STEM, enabling qualitative or quantitative compositional analysis.
Label	AnalyticalElectronMicroscopy
Formal description
Subclass Of	Microscopy

AnodicStrippingVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AnodicStrippingVoltammetry
Annotations
Preflabel	AnodicStrippingVoltammetry
Elucidation	Stripping voltammetry in which material accumulated at the working electrode is electrochemically oxi- dized in the stripping step. A peak-shaped anodic stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution. A solid electrode, carbon paste or composite electrode, bismuth film electrode, mercury film electrode, or static mercury drop electrode may be used.
Comment	Stripping voltammetry in which material accumulated at the working electrode is electrochemically oxi- dized in the stripping step. A peak-shaped anodic stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution. A solid electrode, carbon paste or composite electrode, bismuth film electrode, mercury film electrode, or static mercury drop electrode may be used.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q939328
Label	AnodicStrippingVoltammetry
Formal description
Subclass Of	StrippingVoltammetry

AtomProbeTomography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomProbeTomography
Annotations
Preflabel	AtomProbeTomography
Elucidation	Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy.
Comment	Atom Probe Tomography (APT or 3D Atom Probe) is the only material analysis technique offering extensive capabilities for both 3D imaging and chemical composition measurements at the atomic scale (around 0.1-0.3nm resolution in depth and 0.3-0.5nm laterally). Since its early developments, Atom Probe Tomography has contributed to major advances in materials science. The sample is prepared in the form of a very sharp tip. The cooled tip is biased at high DC voltage (3-15 kV). The very small radius of the tip and the High Voltage induce a very high electrostatic field (tens V/nm) at the tip surface, just below the point of atom evaporation. Under laser or HV pulsing, one or more atoms are evaporated from the surface, by field effect (near 100% ionization), and projected onto a Position Sensitive Detector (PSD) with a very high detection efficiency. Ion efficiencies are as high as 80%, the highest analytical efficiency of any 3D microscopy.
Altlabel	3D Atom Probe
Altlabel	APT
Label	AtomProbeTomography
Formal description
Subclass Of	Tomography

AtomicForceMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#AtomicForceMicroscopy
Annotations
Preflabel	AtomicForceMicroscopy
Elucidation	Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings.
Comment	Atomic force microscopy (AFM) is an influential surface analysis technique used for micro/nanostructured coatings. This flexible technique can be used to obtain high-resolution nanoscale images and study local sites in air (conventional AFM) or liquid (electrochemical AFM) surroundings.
Label	AtomicForceMicroscopy
Formal description
Subclass Of	Microscopy

BPMNDiagram

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#BPMNDiagram
Annotations
Preflabel	BPMNDiagram
Label	BPMNDiagram
Formal description
Subclass Of	Icon

BrunauerEmmettTellerMethod

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#BrunauerEmmettTellerMethod
Annotations
Preflabel	BrunauerEmmettTellerMethod
Elucidation	A technique used to measure the specific surface area of porous materials by analyzing the adsorption of gas molecules onto the material's surface
Comment	A technique used to measure the specific surface area of porous materials by analyzing the adsorption of gas molecules onto the material's surface
Altlabel	BET
Wikidatareference	https://www.wikidata.org/wiki/Q795838
Wikipediareference	https://en.wikipedia.org/wiki/BET_theory
Label	BrunauerEmmettTellerMethod
Formal description
Subclass Of	GasAdsorptionPorosimetry

CalibrationData

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationData
Annotations
Preflabel	CalibrationData
Elucidation	Calibration data are used to provide correction of measured data or perform uncertainty calculations. They are generally the result of a measuerement on a reference specimen.
Comment	Calibration data are used to provide correction of measured data or perform uncertainty calculations. They are generally the result of a measuerement on a reference specimen.
Label	CalibrationData
Formal description
Subclass Of	CharacterisationData

CalibrationProcess

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CalibrationProcess
Annotations
Preflabel	CalibrationProcess
Elucidation	Sequence of operations/actions that are needed to convert the initial signal (as produced by the detector) into a meaningful and useable raw data.
Comment	Usually the calibration process involve a reference sample (with pre-defined, specific, and stable physical characteristics and known properties), in order to extract calibration data. In this way, the accuracy of the measurement tool and its components (for example the probe) will be evaluated and confirmed.
Comment	Operation performed on a measuring instrument or a measuring system that, under specified conditions 1. establishes a relation between the values with measurement uncertainties provided by measurement standards and corresponding indications with associated measurement uncertainties and 2. uses this information to establish a relation for obtaining a measurement result from an indication NOTE 1 The objective of calibration is to provide traceability of measurement results obtained when using a calibrated measuring instrument or measuring system. NOTE 2 The outcome of a calibration may be expressed by a statement, calibration function, calibration diagram, calibration curve, or calibration table. In some cases, it may consist of an additive or multiplicative correction of the indication with associated measurement uncertainty. NOTE 3 Calibration should not be confused with adjustment of a measuring system, often mistakenly called “selfcalibration”, nor with verification of calibration. Calibration is sometimes a prerequisite for verification, which provides confirmation that specified requirements (often maximum permissible errors) are met. Calibration is sometimes also a prerequisite for adjustment, which is the set of operations carried out on a measuring system such that the system provides prescribed indications corresponding to given values of quantities being measured, typically obtained from measurement standards. NOTE 4 Sometimes the first step alone of the operation mentioned in the definition is intended as being calibration, as it was in previous editions of this Vocabulary. The second step is in fact required to establish instrumental uncertainty for the measurement results obtained when using the calibrated measuring system. The two steps together aim to demonstrate the metrological traceability of measurement results obtained by a calibrated measuring system. In the past the second step was usually considered to occur after the calibration. NOTE 5 A comparison between two measurement standards may be viewed as a calibration if the comparison is used to check and, if necessary, correct the value and measurement uncertainty attributed to one of the measurement standards. -- International Vocabulary of Metrology(VIM)
Comment	Sequence of operations/actions that are needed to convert the initial signal (as produced by the detector) into a meaningful and useable raw data.
Comment	Usually the calibration process involve a reference sample (with pre-defined, specific, and stable physical characteristics and known properties), in order to extract calibration data. In this way, the accuracy of the measurement tool and its components (for example the probe) will be evaluated and confirmed.
Definition	Operation performed on a measuring instrument or a measuring system that, under specified conditions 1. establishes a relation between the values with measurement uncertainties provided by measurement standards and corresponding indications with associated measurement uncertainties and 2. uses this information to establish a relation for obtaining a measurement result from an indication NOTE 1 The objective of calibration is to provide traceability of measurement results obtained when using a calibrated measuring instrument or measuring system. NOTE 2 The outcome of a calibration may be expressed by a statement, calibration function, calibration diagram, calibration curve, or calibration table. In some cases, it may consist of an additive or multiplicative correction of the indication with associated measurement uncertainty. NOTE 3 Calibration should not be confused with adjustment of a measuring system, often mistakenly called “selfcalibration”, nor with verification of calibration. Calibration is sometimes a prerequisite for verification, which provides confirmation that specified requirements (often maximum permissible errors) are met. Calibration is sometimes also a prerequisite for adjustment, which is the set of operations carried out on a measuring system such that the system provides prescribed indications corresponding to given values of quantities being measured, typically obtained from measurement standards. NOTE 4 Sometimes the first step alone of the operation mentioned in the definition is intended as being calibration, as it was in previous editions of this Vocabulary. The second step is in fact required to establish instrumental uncertainty for the measurement results obtained when using the calibrated measuring system. The two steps together aim to demonstrate the metrological traceability of measurement results obtained by a calibrated measuring system. In the past the second step was usually considered to occur after the calibration. NOTE 5 A comparison between two measurement standards may be viewed as a calibration if the comparison is used to check and, if necessary, correct the value and measurement uncertainty attributed to one of the measurement standards. -- International Vocabulary of Metrology(VIM)
Example	In nanoindentation, the electrical signal coming from capacitive displacement gauge is converted into a real raw-displacement signal after using a proper calibration function (as obtained by the equipment manufacturer). Then, additional calibration procedures are applied to define the point of initial contact and to correct for instrument compliance, thermal drift, and indenter area function to obtain the real useable displacement data.
Label	CalibrationProcess
Formal description
Subclass Of	CharacterisationProcedure
Subclass Of	hasTemporaryParticipant some ReferenceSample
Subclass Of	hasInput some MeasurementParameter
Subclass Of	hasOutput some CalibrationData
Subclass Of	hasTemporaryParticipant exactly 1 CharacterisationMeasurementInstrument

Calorimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Calorimetry
Annotations
Preflabel	Calorimetry
Elucidation	In chemistry and thermodynamics, calorimetry (from Latin calor 'heat', and Greek μέτρον (metron) 'measure') is the science or act of measuring changes in state variables of a body for the purpose of deriving the heat transfer associated with changes of its state due, for example, to chemical reactions, physical changes, or phase transitions under specified constraints. Calorimetry is performed with a calorimeter.
Comment	In chemistry and thermodynamics, calorimetry (from Latin calor 'heat', and Greek μέτρον (metron) 'measure') is the science or act of measuring changes in state variables of a body for the purpose of deriving the heat transfer associated with changes of its state due, for example, to chemical reactions, physical changes, or phase transitions under specified constraints. Calorimetry is performed with a calorimeter.
Label	Calorimetry
Formal description
Subclass Of	ThermochemicalTesting

CathodicStrippingVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CathodicStrippingVoltammetry
Annotations
Preflabel	CathodicStrippingVoltammetry
Elucidation	Stripping voltammetry in which material accumulated at the working electrode is electrochemically reduced in the stripping step. A peak-shaped cathodic stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution.
Comment	Stripping voltammetry in which material accumulated at the working electrode is electrochemically reduced in the stripping step. A peak-shaped cathodic stripping voltammogram is obtained. Peak current depends on time of accumulation, mass transport of analyte (stirring), scan rate and mode (linear or pulse), and analyte concentration in solution.
Altlabel	CSV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q4016325
Label	CathodicStrippingVoltammetry
Formal description
Subclass Of	StrippingVoltammetry

CharacterisationComponent

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationComponent
Annotations
Preflabel	CharacterisationComponent
Comment
Label	CharacterisationComponent
Formal description
Subclass Of	Component

CharacterisationData

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationData
Annotations
Preflabel	CharacterisationData
Elucidation	Represents every type of data that is produced during a characterisation process
Comment	Represents every type of data that is produced during a characterisation process
Label	CharacterisationData
Formal description
Subclass Of	EncodedData

CharacterisationDataValidation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationDataValidation
Annotations
Preflabel	CharacterisationDataValidation
Elucidation	Procedure to validate the characterisation data.
Comment	Procedure to validate the characterisation data.
Label	CharacterisationDataValidation
Formal description
Subclass Of	DataProcessing

CharacterisationEnvironment

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationEnvironment
Annotations
Preflabel	CharacterisationEnvironment
Elucidation	Medium of the characterisation experiment defined by the set of environmental conditions that are controlled and measured over time during the experiment.
Comment	Characterisation can either be made in air (ambient conditions, without specific controls on environmental parameters), or at different temperatures, different pressures (or in vacuum), or using different types of working gases (inert or reactive with respect to sample), different levels of humidity, etc.
Comment	Characterisation can either be made in air (ambient conditions, without specific controls on environmental parameters), or at different temperatures, different pressures (or in vacuum), or using different types of working gases (inert or reactive with respect to sample), different levels of humidity, etc.
Comment	Medium of the characterisation experiment defined by the set of environmental conditions that are controlled and measured over time during the experiment.
Label	CharacterisationEnvironment
Formal description
Subclass Of	EMMO
Subclass Of	Declared
Subclass Of	hasProperty some CharacterisationEnvironmentProperty

CharacterisationEnvironmentProperty

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationEnvironmentProperty
Annotations
Preflabel	CharacterisationEnvironmentProperty
Comment
Label	CharacterisationEnvironmentProperty
Formal description
Subclass Of	Property

CharacterisationExperiment

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationExperiment
Annotations
Preflabel	CharacterisationExperiment
Elucidation	A characterisation experiment is the process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained.
Comment	A characterisation experiment is the process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained.
Comment	A characterisation experiment is the process by which a material's structure and properties are probed and measured. It is a fundamental process in the field of materials science, without which no scientific understanding of engineering materials could be ascertained.
Label	CharacterisationExperiment
Formal description
Subclass Of	Experiment

CharacterisationHardware

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardware
Annotations
Preflabel	CharacterisationHardware
Elucidation	Whatever hardware is used during the characterisation process.
Comment	Whatever hardware is used during the characterisation process.
Label	CharacterisationHardware
Formal description
Subclass Of	Device

CharacterisationHardwareSpecification

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardwareSpecification
Annotations
Preflabel	CharacterisationHardwareSpecification
Comment
Label	CharacterisationHardwareSpecification
Formal description
Subclass Of	Property

CharacterisationMeasurementInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationMeasurementInstrument
Annotations
Preflabel	CharacterisationMeasurementInstrument
Elucidation	The instrument used for characterising a material, which usually has a probe and a detector as parts.
Comment	Device used for making measurements, alone or in conjunction with one or more supplementary devices NOTE 1 A measuring instrument that can be used alone for making measurements is a measuring system. NOTE 2 A measuring instrument is either an indicating measuring instrument or a material measure.
Comment	The instrument used for characterising a material, which usually has a probe and a detector as parts.
Vimterm	Measuring instrument
Definition	Device used for making measurements, alone or in conjunction with one or more supplementary devices NOTE 1 A measuring instrument that can be used alone for making measurements is a measuring system. NOTE 2 A measuring instrument is either an indicating measuring instrument or a material measure.
Example	In nanoindentation is the nanoindenter
Label	CharacterisationMeasurementInstrument
Formal description
Subclass Of	Whole
Subclass Of	MeasuringInstrument
Subclass Of	CharacterisationHardware
Subclass Of	hasHolisticPart some Detector
Subclass Of	hasHolisticPart some Probe

CharacterisationMeasurementProcess

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationMeasurementProcess
Annotations
Preflabel	CharacterisationMeasurementProcess
Elucidation	The measurement process associates raw data to the sample through a probe and a detector.
Comment	Process of experimentally obtaining one or more values that can reasonably be attributed to a quantity together with any other available relevant information NOTE 1 The quantity mentioned in the definition is an individual quantity. NOTE 2 The relevant information mentioned in the definition may be about the values obtained by the measurement, such that some may be more representative of the measurand than others. NOTE 3 Measurement is sometimes considered to apply to nominal properties, but not in this Vocabulary, where the process of obtaining values of nominal properties is called “examination”. NOTE 4 Measurement requires both experimental comparison of quantities or experimental counting of entities at some step of the process and the use of models and calculations that are based on conceptual considerations. NOTE 5 The conditions of reasonable attribution mentioned in the definition take into account a description of the quantity commensurate with the intended use of a measurement result, a measurement procedure, and a calibrated measuring system operating according to the specified measurement procedure, including the measurement conditions. Moreover, a maximum permissible error and/or a target uncertainty may be specified, and the measurement procedure and the measuring system should then be chosen in order not to exceed these measuring system specifications. -- International Vocabulary of Metrology(VIM)
Comment	The measurement process associates raw data to the sample through a probe and a detector.
Vimterm	Measurement
Definition	Process of experimentally obtaining one or more values that can reasonably be attributed to a quantity together with any other available relevant information NOTE 1 The quantity mentioned in the definition is an individual quantity. NOTE 2 The relevant information mentioned in the definition may be about the values obtained by the measurement, such that some may be more representative of the measurand than others. NOTE 3 Measurement is sometimes considered to apply to nominal properties, but not in this Vocabulary, where the process of obtaining values of nominal properties is called “examination”. NOTE 4 Measurement requires both experimental comparison of quantities or experimental counting of entities at some step of the process and the use of models and calculations that are based on conceptual considerations. NOTE 5 The conditions of reasonable attribution mentioned in the definition take into account a description of the quantity commensurate with the intended use of a measurement result, a measurement procedure, and a calibrated measuring system operating according to the specified measurement procedure, including the measurement conditions. Moreover, a maximum permissible error and/or a target uncertainty may be specified, and the measurement procedure and the measuring system should then be chosen in order not to exceed these measuring system specifications. -- International Vocabulary of Metrology(VIM)
Label	CharacterisationMeasurementProcess
Formal description
Subclass Of	Measurement
Subclass Of	CharacterisationProcedure
Subclass Of	hasTemporaryParticipant some CharacterisationEnvironment
Subclass Of	hasTemporaryParticipant some CharacterisationMeasurementInstrument
Subclass Of	hasTemporaryParticipant some Sample
Subclass Of	hasInput some MeasurementParameter
Subclass Of	hasOutput some CharacterisationData

CharacterisationProcedure

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProcedure
Annotations
Preflabel	CharacterisationProcedure
Elucidation	The process of performing characterisation by following some existing formalised operative rules.
Comment	Characterisation procedure may refer to the full characterisation process or just a part of the full process.
Comment	Characterisation procedure may refer to the full characterisation process or just a part of the full process.
Comment	The process of performing characterisation by following some existing formalised operative rules.
Example	Sample preparation Sample inspection Calibration Microscopy Viscometry Data sampling
Label	CharacterisationProcedure
Formal description
Subclass Of	Procedure

CharacterisationProcedureValidation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProcedureValidation
Annotations
Preflabel	CharacterisationProcedureValidation
Elucidation	Describes why the characterization procedure was chosen and deemed to be the most useful for the sample.
Comment	Describes why the characterization procedure was chosen and deemed to be the most useful for the sample.
Label	CharacterisationProcedureValidation
Formal description
Subclass Of	NominalProperty

CharacterisationProperty

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProperty
Annotations
Preflabel	CharacterisationProperty
Elucidation	The characterisation property is the investigate property or behaviour of a sample. It is derived from the secondary data, usually after classification or quantification (manually or by a model).
Comment	The characterisation property is the investigate property or behaviour of a sample. It is derived from the secondary data, usually after classification or quantification (manually or by a model).
Label	CharacterisationProperty
Formal description
Subclass Of	MeasuredProperty

CharacterisationProtocol

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationProtocol
Annotations
Preflabel	CharacterisationProtocol
Elucidation	A characterisation protocol is defined whenever it is desirable to standardize a laboratory method to ensure successful replication of results by others in the same laboratory or by other laboratories.
Comment	A characterisation protocol is defined whenever it is desirable to standardize a laboratory method to ensure successful replication of results by others in the same laboratory or by other laboratories.
Label	CharacterisationProtocol
Formal description
Subclass Of	CharacterisationProcedure

CharacterisationSoftware

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationSoftware
Annotations
Preflabel	CharacterisationSoftware
Elucidation	A software application to process characterisation data
Comment	A software application to process characterisation data
Example	In Nanoindentation post-processing the software used to apply the Oliver-Pharr to calculate the characterisation properties (i.e. elastic modulus, hardness) from load and depth data.
Label	CharacterisationSoftware
Formal description
Subclass Of	ApplicationProgram

CharacterisationSystem

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationSystem
Annotations
Preflabel	CharacterisationSystem
Elucidation	A set of one or more 'CharacterisationInstruments' and often other devices, including any sample holder, reagent and supply, assembled and adapted to give information used to generate 'MeasuredQuantityProperty' within specified intervals for quantities of specified kinds.
Comment	A set of one or more 'CharacterisationInstruments' and often other devices, including any sample holder, reagent and supply, assembled and adapted to give information used to generate 'MeasuredQuantityProperty' within specified intervals for quantities of specified kinds.
Comment	Set of one or more measuring instruments and often other components, assembled and adapted to give information used to generate measured values within specified intervals for quantities of specified kinds NOTE 1 The components mentioned in the definition may be devices, reagents, and supplies. NOTE 2 A measuring system is sometimes referred to as “measuring equipment” or “device”, for example in ISO 10012, Measurement management systems – Requirements for measurement processes and measuring equipment and ISO 17025, General requirements for the competence of testing and calibration laboratories. NOTE 3 Although the terms “measuring system” and “measurement system” are frequently used synonymously, the latter is instead sometimes used to refer to a measuring system plus all other entities involved in a measurement, including the object under measurement and the person(s) performing the measurement. NOTE 4 A measuring system can be used as a measurement standard.
Vimterm	Measuring system
Definition	Set of one or more measuring instruments and often other components, assembled and adapted to give information used to generate measured values within specified intervals for quantities of specified kinds NOTE 1 The components mentioned in the definition may be devices, reagents, and supplies. NOTE 2 A measuring system is sometimes referred to as “measuring equipment” or “device”, for example in ISO 10012, Measurement management systems – Requirements for measurement processes and measuring equipment and ISO 17025, General requirements for the competence of testing and calibration laboratories. NOTE 3 Although the terms “measuring system” and “measurement system” are frequently used synonymously, the latter is instead sometimes used to refer to a measuring system plus all other entities involved in a measurement, including the object under measurement and the person(s) performing the measurement. NOTE 4 A measuring system can be used as a measurement standard.
Label	CharacterisationSystem
Formal description
Subclass Of	HolisticSystem
Subclass Of	MeasuringSystem
Subclass Of	hasConstituent some CharacterisationComponent

CharacterisationTask

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationTask
Annotations
Preflabel	CharacterisationTask
Comment
Label	CharacterisationTask
Formal description
Equivalent To	Task and CharacterisationProcedure
Subclass Of	Task
Subclass Of	CharacterisationProcedure
Subclass Of	Inverse(hasTask) some CharacterisationWorkflow

CharacterisationTechnique

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationTechnique
Annotations
Preflabel	CharacterisationTechnique
Elucidation	The description of the overall characterisation technique. It can be composed of different steps (e.g. sample preparation, calibration, measurement, post-processing).
Comment	A characterisation technique is not only related to the measurement process which can be one of its steps.
Comment	The description of the overall characterisation technique. It can be composed of different steps (e.g. sample preparation, calibration, measurement, post-processing).
Comment	A characterisation technique is not only related to the measurement process which can be one of its steps.
Altlabel	Characterisation procedure
Altlabel	Characterisation technique
Label	CharacterisationTechnique
Formal description
Subclass Of	FunctionalIcon

CharacterisationWorkflow

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationWorkflow
Annotations
Preflabel	CharacterisationWorkflow
Elucidation	A characterisation procedure that has at least two characterisation tasks as proper parts.
Comment	A characterisation procedure that has at least two characterisation tasks as proper parts.
Label	CharacterisationWorkflow
Formal description
Equivalent To	Workflow and CharacterisationProcedure
Subclass Of	Workflow
Subclass Of	CharacterisationProcedure
Subclass Of	hasTask some CharacterisationTask

CharacterisedSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisedSample
Annotations
Preflabel	CharacterisedSample
Elucidation	The sample after having been subjected to a characterization process
Comment	The sample after having been subjected to a characterization process
Label	CharacterisedSample
Formal description
Subclass Of	Sample

ChargeDistribution

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ChargeDistribution
Annotations
Preflabel	ChargeDistribution
Comment
Label	ChargeDistribution
Formal description
Subclass Of	CharacterisationTechnique

Chromatography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chromatography
Annotations
Preflabel	Chromatography
Elucidation	In chemical analysis, chromatography is a laboratory technique for the separation of a mixture into its components.
Comment	In chemical analysis, chromatography is a laboratory technique for the separation of a mixture into its components.
Wikipediareference	https://en.wikipedia.org/wiki/Chromatography
Label	Chromatography
Formal description
Subclass Of	CharacterisationTechnique

Chronoamperometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chronoamperometry
Annotations
Preflabel	Chronoamperometry
Elucidation	Amperometry in which the current is measured as a function of time after a change in the applied potential. If the potential step is from a potential at which no current flows (i.e., at which the oxidation or reduction of the electrochemically active species does not take place) to one at which the current is limited by diffusion (see diffusion-limited current), the current obeys the Cottrell equation.
Comment	Amperometry in which the current is measured as a function of time after a change in the applied potential. If the potential step is from a potential at which no current flows (i.e., at which the oxidation or reduction of the electrochemically active species does not take place) to one at which the current is limited by diffusion (see diffusion-limited current), the current obeys the Cottrell equation.
Altlabel	AmperiometricDetection
Altlabel	AmperometricCurrentTimeCurve
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	Chronoamperometry
Formal description
Subclass Of	Amperometry

Chronocoulometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chronocoulometry
Annotations
Preflabel	Chronocoulometry
Elucidation	Direct coulometry at controlled potential in which the electric charge passed after the application of a potential step perturbation is measured as a function of time (Q-t curve). Chronocoulometry provides the same information that is provided by chronoamperometry, since it is based on the integration of the I-t curve. Nevertheless, chronocoulometry offers important experimental advantages, such as (i) the measured signal usually increases with time and hence the later parts of the transient can be detected more accurately, (ii) a better signal-to-noise ratio can be achieved, and (iii) other contributions to overall charge passed as a function of time can be discriminated from those due to the diffusion of electroactive substances.
Comment	Direct coulometry at controlled potential in which the electric charge passed after the application of a potential step perturbation is measured as a function of time (Q-t curve). Chronocoulometry provides the same information that is provided by chronoamperometry, since it is based on the integration of the I-t curve. Nevertheless, chronocoulometry offers important experimental advantages, such as (i) the measured signal usually increases with time and hence the later parts of the transient can be detected more accurately, (ii) a better signal-to-noise ratio can be achieved, and (iii) other contributions to overall charge passed as a function of time can be discriminated from those due to the diffusion of electroactive substances.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	Chronocoulometry
Formal description
Subclass Of	Coulometry

Chronopotentiometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Chronopotentiometry
Annotations
Preflabel	Chronopotentiometry
Elucidation	Potentiometry in which the potential is measured with time following a change in applied current. The change in applied current is usually a step, but cyclic current reversals or linearly increasing currents are also used.
Comment	Potentiometry in which the potential is measured with time following a change in applied current. The change in applied current is usually a step, but cyclic current reversals or linearly increasing currents are also used.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	Chronopotentiometry
Formal description
Subclass Of	Potentiometry

CompressionTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CompressionTesting
Annotations
Preflabel	CompressionTesting
Elucidation	Compression tests characterize material and product strength and stiffness under applied crushing loads. These tests are typically conducted by applying compressive pressure to a test specimen using platens or specialized fixtures with a testing machine that produces compressive loads.
Comment	Compression tests characterize material and product strength and stiffness under applied crushing loads. These tests are typically conducted by applying compressive pressure to a test specimen using platens or specialized fixtures with a testing machine that produces compressive loads.
Label	CompressionTesting
Formal description
Subclass Of	MechanicalTesting

ConductometricTitration

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ConductometricTitration
Annotations
Preflabel	ConductometricTitration
Elucidation	Titration in which the electric conductivity of a solution is measured as a function of the amount of titrant added. The equivalence-point is obtained as the intersection of linear parts of the conductance G, versus titrant volume V, curve. The method can be used for deeply coloured or turbid solutions. Acid-base and precipitation reactions are most frequently used. The method is based on replacing an ionic species of the analyte with another species, cor- responding to the titrant or the product with significantly different conductance.
Comment	Titration in which the electric conductivity of a solution is measured as a function of the amount of titrant added. The equivalence-point is obtained as the intersection of linear parts of the conductance G, versus titrant volume V, curve. The method can be used for deeply coloured or turbid solutions. Acid-base and precipitation reactions are most frequently used. The method is based on replacing an ionic species of the analyte with another species, cor- responding to the titrant or the product with significantly different conductance.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q11778221
Label	ConductometricTitration
Formal description
Subclass Of	Conductometry

Conductometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Conductometry
Annotations
Preflabel	Conductometry
Elucidation	Measurement principle in which the electric conductivity of a solution is measured. The conductivity of a solution depends on the concentration and nature of ions present.
Comment	Measurement principle in which the electric conductivity of a solution is measured. The conductivity of a solution depends on the concentration and nature of ions present.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Example	Monitoring of the purity of deionized water.
Wikidatareference	https://www.wikidata.org/wiki/Q901180
Wikipediareference	https://en.wikipedia.org/wiki/Conductometry
Label	Conductometry
Formal description
Subclass Of	ElectrochemicalTesting

ConfocalMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ConfocalMicroscopy
Annotations
Preflabel	ConfocalMicroscopy
Elucidation	Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast of a micrograph by means of using a spatial pinhole to block out-of-focus light in image formation.
Comment	Confocal microscopy, most frequently confocal laser scanning microscopy (CLSM) or laser scanning confocal microscopy (LSCM), is an optical imaging technique for increasing optical resolution and contrast of a micrograph by means of using a spatial pinhole to block out-of-focus light in image formation.
Label	ConfocalMicroscopy
Formal description
Subclass Of	Microscopy

CoulometricTitration

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CoulometricTitration
Annotations
Preflabel	CoulometricTitration
Elucidation	Titration in which the titrant is generated electrochemically, either by constant current or at constant potential. The titrant reacts stoichiometrically with the analyte, the amount of which is calculated using Faraday’s laws of electrolysis from the electric charge required to reach the end-point. Coulometric titrations are usually carried out in convective mass transfer mode using a large surface working electrode. The reference and auxiliary electrodes are located in sepa- rate compartments. A basic requirement is a 100 % current efficiency of titrant generation at the working electrode. End-point detection can be accomplished with potentiometry, amperometry, biamperometry, bipotentiometry, photometry, or by using a visual indicator. The main advantages are that titration is possible with less stable titrants, the standardi- zation of titrant is not necessary, the volume of the test solution is not changed, and the method is easily automated.
Comment	Titration in which the titrant is generated electrochemically, either by constant current or at constant potential. The titrant reacts stoichiometrically with the analyte, the amount of which is calculated using Faraday’s laws of electrolysis from the electric charge required to reach the end-point. Coulometric titrations are usually carried out in convective mass transfer mode using a large surface working electrode. The reference and auxiliary electrodes are located in sepa- rate compartments. A basic requirement is a 100 % current efficiency of titrant generation at the working electrode. End-point detection can be accomplished with potentiometry, amperometry, biamperometry, bipotentiometry, photometry, or by using a visual indicator. The main advantages are that titration is possible with less stable titrants, the standardi- zation of titrant is not necessary, the volume of the test solution is not changed, and the method is easily automated.
Label	CoulometricTitration
Formal description
Subclass Of	Coulometry

Coulometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Coulometry
Annotations
Preflabel	Coulometry
Elucidation	Electrochemical measurement principle in which the electric charge required to carry out a known electrochemical reaction is measured. By Faraday’s laws of electrolysis, the amount of substance is proportional to the charge. Coulometry used to measure the amount of substance is a primary reference measurement procedure [VIM 2.8] not requiring calibration with a standard for a quantity of the same kind (i.e. amount of substance). The coulometric experiment can be carried out at controlled (constant) potential (see direct coulometry at controlled potential) or controlled (constant) current (see direct coulometry at controlled current).
Comment	Electrochemical measurement principle in which the electric charge required to carry out a known electrochemical reaction is measured. By Faraday’s laws of electrolysis, the amount of substance is proportional to the charge. Coulometry used to measure the amount of substance is a primary reference measurement procedure [VIM 2.8] not requiring calibration with a standard for a quantity of the same kind (i.e. amount of substance). The coulometric experiment can be carried out at controlled (constant) potential (see direct coulometry at controlled potential) or controlled (constant) current (see direct coulometry at controlled current).
Ievreference	https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-04-13
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q1136979
Wikipediareference	https://en.wikipedia.org/wiki/Coulometry
Label	Coulometry
Formal description
Subclass Of	ElectrochemicalTesting

CreepTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CreepTesting
Annotations
Preflabel	CreepTesting
Elucidation	The creep test is a destructive materials testing method for determination of the long-term strength and heat resistance of a material. When running a creep test, the specimen is subjected to increased temperature conditions for an extended period of time and loaded with a constant tensile force or tensile stress.
Comment	The creep test is a destructive materials testing method for determination of the long-term strength and heat resistance of a material. When running a creep test, the specimen is subjected to increased temperature conditions for an extended period of time and loaded with a constant tensile force or tensile stress.
Label	CreepTesting
Formal description
Subclass Of	MechanicalTesting

CriticalAndSupercriticalChromatography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CriticalAndSupercriticalChromatography
Annotations
Preflabel	CriticalAndSupercriticalChromatography
Comment
Label	CriticalAndSupercriticalChromatography
Formal description
Subclass Of	Chromatography

CyclicChronopotentiometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CyclicChronopotentiometry
Annotations
Preflabel	CyclicChronopotentiometry
Elucidation	Chronopotentiometry where the change in applied current undergoes a cyclic current reversal.
Elucidation	chronopotentiometry where the change in applied current undergoes a cyclic current reversal
Comment	Chronopotentiometry where the change in applied current undergoes a cyclic current reversal.
Label	CyclicChronopotentiometry
Formal description
Subclass Of	Chronopotentiometry

CyclicVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CyclicVoltammetry
Annotations
Preflabel	CyclicVoltammetry
Elucidation	Voltammetry in which the electric current is recorded as the electrode potential is varied with time cyclically between two potential limits, normally at a constant scan rate. Cyclic voltammetry is frequently used for the investigation of mechanisms of electrochemical/electrode reactions. The current-potential curve may be modelled to obtain reaction mechanisms and electrochemical parameters. Normally the initial potential is chosen where no electrode reaction occurs and the switching potential is greater (more positive for an oxidation or more negative for a reduction) than the peak potential of the analyte reaction. The initial potential is usually the negative or positive limit of the cycle but can have any value between the two limits, as can the initial scan direction. The limits of the potential are known as the switching potentials. The plot of current against potential is termed a cyclic voltammogram. Usually peak-shaped responses are obtained for scans in both directions.
Comment	Voltammetry in which the electric current is recorded as the electrode potential is varied with time cyclically between two potential limits, normally at a constant scan rate. Cyclic voltammetry is frequently used for the investigation of mechanisms of electrochemical/electrode reactions. The current-potential curve may be modelled to obtain reaction mechanisms and electrochemical parameters. Normally the initial potential is chosen where no electrode reaction occurs and the switching potential is greater (more positive for an oxidation or more negative for a reduction) than the peak potential of the analyte reaction. The initial potential is usually the negative or positive limit of the cycle but can have any value between the two limits, as can the initial scan direction. The limits of the potential are known as the switching potentials. The plot of current against potential is termed a cyclic voltammogram. Usually peak-shaped responses are obtained for scans in both directions.
Altlabel	CV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Dbpediareference	https://dbpedia.org/page/Cyclic_voltammetry
Wikidatareference	https://www.wikidata.org/wiki/Q1147647
Wikipediareference	https://en.wikipedia.org/wiki/Cyclic_voltammetry
Label	CyclicVoltammetry
Formal description
Subclass Of	Voltammetry

DCPolarography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DCPolarography
Annotations
Preflabel	DCPolarography
Elucidation	Linear scan voltammetry with slow scan rate in which a dropping mercury electrode is used as the working electrode. If the whole scan is performed on a single growing drop, the technique should be called single drop scan voltammetry. The term polarography in this context is discouraged. This is the oldest variant of polarographic techniques, introduced by Jaroslav Heyrovský (1890 – 1967). Usually the drop time is between 1 and 5 s and the pseudo-steady-state wave-shaped dependence on potential is called a polarogram. If the limiting current is controlled by diffusion, it is expressed by the Ilkovich equation.
Comment	Linear scan voltammetry with slow scan rate in which a dropping mercury electrode is used as the working electrode. If the whole scan is performed on a single growing drop, the technique should be called single drop scan voltammetry. The term polarography in this context is discouraged. This is the oldest variant of polarographic techniques, introduced by Jaroslav Heyrovský (1890 – 1967). Usually the drop time is between 1 and 5 s and the pseudo-steady-state wave-shaped dependence on potential is called a polarogram. If the limiting current is controlled by diffusion, it is expressed by the Ilkovich equation.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	DCPolarography
Formal description
Subclass Of	Voltammetry

DataAcquisitionRate

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataAcquisitionRate
Annotations
Preflabel	DataAcquisitionRate
Elucidation	Quantifies the raw data acquisition rate, if applicable.
Comment	Quantifies the raw data acquisition rate, if applicable.
Label	DataAcquisitionRate
Formal description
Subclass Of	Property

DataAnalysis

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataAnalysis
Annotations
Preflabel	DataAnalysis
Elucidation	Data processing activities performed on the secondary data to determine the characterisation property (e.g. classification, quantification), which can be performed manually or exploiting a model.
Comment	Data processing activities performed on the secondary data to determine the characterisation property (e.g. classification, quantification), which can be performed manually or exploiting a model.
Label	DataAnalysis
Formal description
Subclass Of	DataProcessing

DataFiltering

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataFiltering
Annotations
Preflabel	DataFiltering
Elucidation	Data filtering is the process of examining a dataset to exclude, rearrange, or apportion data according to certain criteria.
Comment	Data filtering is the process of examining a dataset to exclude, rearrange, or apportion data according to certain criteria.
Label	DataFiltering
Formal description
Subclass Of	DataPreparation

DataNormalisation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataNormalisation
Annotations
Preflabel	DataNormalisation
Elucidation	Data normalization involves adjusting raw data to a notionally common scale.
Comment	It involves the creation of shifted and/or scaled versions of the values to allow post-processing in a way that eliminates the effects of influences on subsequent properties extraction.
Comment	Data normalization involves adjusting raw data to a notionally common scale.
Comment	It involves the creation of shifted and/or scaled versions of the values to allow post-processing in a way that eliminates the effects of influences on subsequent properties extraction.
Label	DataNormalisation
Formal description
Subclass Of	DataPreparation

DataPostProcessing

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataPostProcessing
Annotations
Preflabel	DataPostProcessing
Elucidation	Analysis, that allows one to calculate the final material property from the calibrated primary data.
Comment	Analysis, that allows one to calculate the final material property from the calibrated primary data.
Label	DataPostProcessing
Formal description
Subclass Of	DataProcessing

DataPreparation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataPreparation
Annotations
Preflabel	DataPreparation
Elucidation	Data preparation is the process of manipulating (or pre-processing) data (which may come from disparate data sources) to improve their quality or reduce bias in subsequent analysis.
Comment	Data preparation is the process of manipulating (or pre-processing) data (which may come from disparate data sources) to improve their quality or reduce bias in subsequent analysis.
Label	DataPreparation
Formal description
Subclass Of	DataProcessing

DataProcessingThroughCalibration

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataProcessingThroughCalibration
Annotations
Preflabel	DataProcessingThroughCalibration
Elucidation	Describes how raw data are corrected and/or modified through calibrations.
Comment	Describes how raw data are corrected and/or modified through calibrations.
Label	DataProcessingThroughCalibration
Formal description
Subclass Of	Thing

DataQuality

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DataQuality
Annotations
Preflabel	DataQuality
Elucidation	Evaluation of quality indicators to determine how well suited a data set is to be used for the characterisation of a material.
Comment	Evaluation of quality indicators to determine how well suited a data set is to be used for the characterisation of a material.
Example	Example evaluation of S/N ratio, or other quality indicators (limits of detection/quantification, statistical analysis of data, data robustness analysis)
Label	DataQuality
Formal description
Subclass Of	Thing

Detector

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Detector
Annotations
Preflabel	Detector
Elucidation	Physical device (or the chain of devices) that is used to measure, quantify and store the signal after its interaction with the sample.
Comment	Physical device (or the chain of devices) that is used to measure, quantify and store the signal after its interaction with the sample.
Example	Back Scattered Electrons (BSE) and Secondary Electrons (SE) detectors for SEM
Example	Displacement and force sensors for mechanical testing
Label	Detector
Formal description
Subclass Of	CharacterisationHardware

DielectricAndImpedanceSpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DielectricAndImpedanceSpectroscopy
Annotations
Preflabel	DielectricAndImpedanceSpectroscopy
Elucidation	Dielectric spectroscopy (DS) or impedance spectroscopy, also known as electrochemical impedance spectroscopy, is frequently used to study the response of a sample subjected to an applied electric field of fixed or changing frequency. DS describes the dielectric properties of a material as a function of frequency. In DS, the radio and microwave frequency regions of the electromagnetic spectrum have been successfully made to interact with materials, so as to study the behavior of molecules. The interaction of applied alternating electric fields with dipoles possessing reorientation mobility in materials is also dealt by DS.
Comment	Dielectric spectroscopy (DS) or impedance spectroscopy, also known as electrochemical impedance spectroscopy, is frequently used to study the response of a sample subjected to an applied electric field of fixed or changing frequency. DS describes the dielectric properties of a material as a function of frequency. In DS, the radio and microwave frequency regions of the electromagnetic spectrum have been successfully made to interact with materials, so as to study the behavior of molecules. The interaction of applied alternating electric fields with dipoles possessing reorientation mobility in materials is also dealt by DS.
Label	DielectricAndImpedanceSpectroscopy
Formal description
Subclass Of	Spectroscopy

Dielectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Dielectrometry
Annotations
Preflabel	Dielectrometry
Elucidation	Electrochemical measurement principle based on the measurement of the dielectric constant of a sample resulting from the orientation of particles (molecules or ions) that have a dipole moment in an electric field. Dielectrometric titrations use dielectrometry for the end-point detection. The method is used to monitor the purity of dielectrics, for example to detect small amounts of moisture.
Comment	Electrochemical measurement principle based on the measurement of the dielectric constant of a sample resulting from the orientation of particles (molecules or ions) that have a dipole moment in an electric field. Dielectrometric titrations use dielectrometry for the end-point detection. The method is used to monitor the purity of dielectrics, for example to detect small amounts of moisture.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	Dielectrometry
Formal description
Subclass Of	ElectrochemicalTesting

DifferentialLinearPulseVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialLinearPulseVoltammetry
Annotations
Preflabel	DifferentialLinearPulseVoltammetry
Elucidation	Differential Pulse Voltammetry in which small potential pulses are superimposed onto a linearly varying potential.
Comment	Differential Pulse Voltammetry in which small potential pulses are superimposed onto a linearly varying potential.
Label	DifferentialLinearPulseVoltammetry
Formal description
Subclass Of	DifferentialPulseVoltammetry

DifferentialPulseVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialPulseVoltammetry
Annotations
Preflabel	DifferentialPulseVoltammetry
Elucidation	Voltammetry in which small potential pulses (constant height 10 to 100 mV, constant width 10 to 100 ms) are superimposed onto a linearly varying potential or onto a staircase potential ramp. The current is sampled just before the onset of the pulse (e.g. 10 to 20 ms) and for the same sampling time just before the end of the pulse. The difference between the two sampled currents is plotted versus the potential applied before the pulse. Thus, a differential pulse voltammogram is peak-shaped. Differential pulse polarography is differential pulse voltammetry in which a dropping mercury electrode is used as the working electrode. A pulse is applied before the mechani- cally enforced end of the drop and the current is sampled twice: just before the onset of the pulse and just before its end. The pulse width is usually 10 to 20 % of the drop life. The drop dislodgement is synchronized with current sampling, which is carried out as in DPV. The ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated in the same way as in normal pulse voltammetry (NPV). Moreover, subtraction of the charging current sampled before the application of the pulse further decreases its negative influence. Due to the more enhanced signal (faradaic current) to noise (charging current) ratio, the limit of detection is lower than with NPV. The sensitivity of DPV depends on the reversibility of the electrode reaction of the analyte.
Comment	Voltammetry in which small potential pulses (constant height 10 to 100 mV, constant width 10 to 100 ms) are superimposed onto a linearly varying potential or onto a staircase potential ramp. The current is sampled just before the onset of the pulse (e.g. 10 to 20 ms) and for the same sampling time just before the end of the pulse. The difference between the two sampled currents is plotted versus the potential applied before the pulse. Thus, a differential pulse voltammogram is peak-shaped. Differential pulse polarography is differential pulse voltammetry in which a dropping mercury electrode is used as the working electrode. A pulse is applied before the mechani- cally enforced end of the drop and the current is sampled twice: just before the onset of the pulse and just before its end. The pulse width is usually 10 to 20 % of the drop life. The drop dislodgement is synchronized with current sampling, which is carried out as in DPV. The ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated in the same way as in normal pulse voltammetry (NPV). Moreover, subtraction of the charging current sampled before the application of the pulse further decreases its negative influence. Due to the more enhanced signal (faradaic current) to noise (charging current) ratio, the limit of detection is lower than with NPV. The sensitivity of DPV depends on the reversibility of the electrode reaction of the analyte.
Altlabel	DPV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q5275361
Wikipediareference	https://en.wikipedia.org/wiki/Differential_pulse_voltammetry
Label	DifferentialPulseVoltammetry
Formal description
Subclass Of	Voltammetry

DifferentialRefractiveIndex

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialRefractiveIndex
Annotations
Preflabel	DifferentialRefractiveIndex
Comment
Label	DifferentialRefractiveIndex
Formal description
Subclass Of	OpticalTesting

DifferentialScanningCalorimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialScanningCalorimetry
Annotations
Preflabel	DifferentialScanningCalorimetry
Elucidation	Differential scanning calorimetry (DSC) is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature. Both the sample and reference are maintained at nearly the same temperature throughout the experiment. Generally, the temperature program for a DSC analysis is designed such that the sample holder temperature increases linearly as a function of time. The reference sample should have a well-defined heat capacity over the range of temperatures to be scanned. Additionally, the reference sample must be stable, of high purity, and must not experience much change across the temperature scan. Typically, reference standards have been metals such as indium, tin, bismuth, and lead, but other standards such as polyethylene and fatty acids have been proposed to study polymers and organic compounds, respectively.
Comment	Differential scanning calorimetry (DSC) is a thermoanalytical technique in which the difference in the amount of heat required to increase the temperature of a sample and reference is measured as a function of temperature. Both the sample and reference are maintained at nearly the same temperature throughout the experiment. Generally, the temperature program for a DSC analysis is designed such that the sample holder temperature increases linearly as a function of time. The reference sample should have a well-defined heat capacity over the range of temperatures to be scanned. Additionally, the reference sample must be stable, of high purity, and must not experience much change across the temperature scan. Typically, reference standards have been metals such as indium, tin, bismuth, and lead, but other standards such as polyethylene and fatty acids have been proposed to study polymers and organic compounds, respectively.
Altlabel	DSC
Label	DifferentialScanningCalorimetry
Formal description
Subclass Of	ThermochemicalTesting

DifferentialStaircasePulseVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialStaircasePulseVoltammetry
Annotations
Preflabel	DifferentialStaircasePulseVoltammetry
Elucidation	Differential Pulse Voltammetry in which small potential pulses are superimposed onto a staircase potential ramp.
Comment	Differential Pulse Voltammetry in which small potential pulses are superimposed onto a staircase potential ramp.
Label	DifferentialStaircasePulseVoltammetry
Formal description
Subclass Of	DifferentialPulseVoltammetry

DifferentialThermalAnalysis

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DifferentialThermalAnalysis
Annotations
Preflabel	DifferentialThermalAnalysis
Elucidation	Differential thermal analysis (DTA) is a thermoanalytic technique that is similar to differential scanning calorimetry. In DTA, the material under study and an inert reference are made to undergo identical thermal cycles, (i.e., same cooling or heating programme) while recording any temperature difference between sample and reference.[1] This differential temperature is then plotted against time, or against temperature (DTA curve, or thermogram). Changes in the sample, either exothermic or endothermic, can be detected relative to the inert reference. Thus, a DTA curve provides data on the transformations that have occurred, such as glass transitions, crystallization, melting and sublimation. The area under a DTA peak is the enthalpy change and is not affected by the heat capacity of the sample.
Comment	Differential thermal analysis (DTA) is a thermoanalytic technique that is similar to differential scanning calorimetry. In DTA, the material under study and an inert reference are made to undergo identical thermal cycles, (i.e., same cooling or heating programme) while recording any temperature difference between sample and reference.[1] This differential temperature is then plotted against time, or against temperature (DTA curve, or thermogram). Changes in the sample, either exothermic or endothermic, can be detected relative to the inert reference. Thus, a DTA curve provides data on the transformations that have occurred, such as glass transitions, crystallization, melting and sublimation. The area under a DTA peak is the enthalpy change and is not affected by the heat capacity of the sample.
Altlabel	DTA
Label	DifferentialThermalAnalysis
Formal description
Subclass Of	ThermochemicalTesting

Dilatometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Dilatometry
Annotations
Preflabel	Dilatometry
Elucidation	Dilatometry is a method for characterising the dimensional changes of materials with variation of temperature conditions.
Comment	Dilatometry is a method for characterising the dimensional changes of materials with variation of temperature conditions.
Label	Dilatometry
Formal description
Subclass Of	CharacterisationTechnique

DirectCoulometryAtControlledCurrent

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCoulometryAtControlledCurrent
Annotations
Preflabel	DirectCoulometryAtControlledCurrent
Elucidation	Coulometry at an imposed, constant current in the electrochemical cell. Direct coulometry at controlled current is usually carried out in convective mass transfer mode. The end-point of the electrolysis, at which the current is stopped, must be determined either from the inflection point in the E–t curve or by using visual or objective end-point indi- cation, similar to volumetric methods. The total electric charge is calculated as the product of the constant current and time of electrolysis or can be measured directly using a coulometer. The advantage of this method is that the electric charge consumed during the electrode reaction is directly proportional to the electrolysis time. Care must be taken to avoid the potential region where another electrode reaction may occur.
Comment	Coulometry at an imposed, constant current in the electrochemical cell. Direct coulometry at controlled current is usually carried out in convective mass transfer mode. The end-point of the electrolysis, at which the current is stopped, must be determined either from the inflection point in the E–t curve or by using visual or objective end-point indi- cation, similar to volumetric methods. The total electric charge is calculated as the product of the constant current and time of electrolysis or can be measured directly using a coulometer. The advantage of this method is that the electric charge consumed during the electrode reaction is directly proportional to the electrolysis time. Care must be taken to avoid the potential region where another electrode reaction may occur.
Label	DirectCoulometryAtControlledCurrent
Formal description
Subclass Of	Coulometry

DirectCoulometryAtControlledPotential

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCoulometryAtControlledPotential
Annotations
Preflabel	DirectCoulometryAtControlledPotential
Elucidation	Coulometry at a preselected constant potential of the working electrode. Direct coulometry at controlled potential is usually carried out in convective mass trans- fer mode using a large surface working electrode. Reference and auxiliary electrodes are placed in separate compartments. The total electric charge is obtained by integration of the I–t curve or can be measured directly using a coulometer.
Elucidation	In principle, the end point at which I = 0, i.e. when the concentration of species under study becomes zero, can be reached only at infinite time. However, in practice, the electrolysis is stopped when the current has decayed to a few percent of the initial value and the charge passed at infinite time is calculated from a plot of charge Q(t) against time t. For a simple system under diffusion control Qt= Q∞[1 − exp(−DAt/Vδ)], where Q∞ = limt→∞Q(t) is the total charge passed at infinite time, D is the diffusion coefficient of the electroactive species, A the electrode area, δ the diffusion layer thickness, and V the volume of the solution.
Comment	Coulometry at a preselected constant potential of the working electrode. Direct coulometry at controlled potential is usually carried out in convective mass trans- fer mode using a large surface working electrode. Reference and auxiliary electrodes are placed in separate compartments. The total electric charge is obtained by integration of the I–t curve or can be measured directly using a coulometer.
Comment	In principle, the end point at which I = 0, i.e. when the concentration of species under study becomes zero, can be reached only at infinite time. However, in practice, the electrolysis is stopped when the current has decayed to a few percent of the initial value and the charge passed at infinite time is calculated from a plot of charge Q(t) against time t. For a simple system under diffusion control Qt= Q∞[1 − exp(−DAt/Vδ)], where Q∞ = limt→∞Q(t) is the total charge passed at infinite time, D is the diffusion coefficient of the electroactive species, A the electrode area, δ the diffusion layer thickness, and V the volume of the solution.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	DirectCoulometryAtControlledPotential
Formal description
Subclass Of	Coulometry

DirectCurrentInternalResistance

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DirectCurrentInternalResistance
Annotations
Preflabel	DirectCurrentInternalResistance
Elucidation	Method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current.
Comment	Method of determining the internal resistance of an electrochemical cell by applying a low current followed by higher current within a short period, and then record the changes of battery voltage and current.
Label	DirectCurrentInternalResistance
Formal description
Subclass Of	Chronopotentiometry

DynamicLightScattering

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicLightScattering
Annotations
Preflabel	DynamicLightScattering
Elucidation	Dynamic light scattering (DLS) is a technique in physics that can be used to determine the size distribution profile of small particles in suspension or polymers in solution. In the scope of DLS, temporal fluctuations are usually analyzed using the intensity or photon auto-correlation function (also known as photon correlation spectroscopy - PCS or quasi-elastic light scattering - QELS).
Comment	Dynamic light scattering (DLS) is a technique in physics that can be used to determine the size distribution profile of small particles in suspension or polymers in solution. In the scope of DLS, temporal fluctuations are usually analyzed using the intensity or photon auto-correlation function (also known as photon correlation spectroscopy - PCS or quasi-elastic light scattering - QELS).
Altlabel	DLS
Label	DynamicLightScattering
Formal description
Subclass Of	OpticalTesting

DynamicMechanicalAnalysis

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicMechanicalAnalysis
Annotations
Preflabel	DynamicMechanicalAnalysis
Elucidation	Dynamic mechanical analysis (abbreviated DMA) is a characterisation technique where a sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus. The temperature of the sample or the frequency of the stress are often varied, leading to variations in the complex modulus; this approach can be used to locate the glass transition temperature[1] of the material, as well as to identify transitions corresponding to other molecular motions.
Comment	Dynamic mechanical analysis (abbreviated DMA) is a characterisation technique where a sinusoidal stress is applied and the strain in the material is measured, allowing one to determine the complex modulus. The temperature of the sample or the frequency of the stress are often varied, leading to variations in the complex modulus; this approach can be used to locate the glass transition temperature[1] of the material, as well as to identify transitions corresponding to other molecular motions.
Label	DynamicMechanicalAnalysis
Formal description
Subclass Of	MechanicalTesting

DynamicMechanicalSpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#DynamicMechanicalSpectroscopy
Annotations
Preflabel	DynamicMechanicalSpectroscopy
Elucidation	Dynamic Mechanical Analysis (DMA) is a material characterization technique where a small deformation is applied to a sample in a cyclic manner. This allows measurement of the materials response to stress, temperature, frequency or time. The term is also used to refer to the analyzer that performs the test.
Comment	Dynamic Mechanical Analysis (DMA) is a material characterization technique where a small deformation is applied to a sample in a cyclic manner. This allows measurement of the materials response to stress, temperature, frequency or time. The term is also used to refer to the analyzer that performs the test.
Altlabel	DMA
Label	DynamicMechanicalSpectroscopy
Formal description
Subclass Of	Spectroscopy

ElectrochemicalImpedanceSpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalImpedanceSpectroscopy
Annotations
Preflabel	ElectrochemicalImpedanceSpectroscopy
Elucidation	Electrochemical measurement method of the complex impedance of an electrochemical system as a function of the frequency of a small amplitude (normally 5 to 10 mV) sinusoidal voltage perturbation superimposed on a fixed value of applied potential or on the open circuit potential. Impedimetric sensors are based on measurement of a concentration-dependent parameter taken from analysis of the respective electrochemical impedance spectra, or from the impedance magnitudes at a chosen fixed frequency. The sinusoidal current response lags behind the sinusoidal voltage perturbation by a phase angle φ. Resistances (e.g. to charge transfer) give a response in phase with the voltage perturbation; capacitances (e.g. double layer) give a response 90° out of phase; combinations of resistances and capacitances give phase angles between 0 and 90°. Plots of the out of phase vs. the in phase component of the impedance for all the frequencies tested are called complex plane (or Nyquist) plots. Plots of the phase angle and the magnitude of the impedance vs. the logarithm of perturbation frequency are called Bode diagrams. Complex plane plots are the more commonly used for electrochemical sensors.
Comment	Electrochemical measurement method of the complex impedance of an electrochemical system as a function of the frequency of a small amplitude (normally 5 to 10 mV) sinusoidal voltage perturbation superimposed on a fixed value of applied potential or on the open circuit potential. Impedimetric sensors are based on measurement of a concentration-dependent parameter taken from analysis of the respective electrochemical impedance spectra, or from the impedance magnitudes at a chosen fixed frequency. The sinusoidal current response lags behind the sinusoidal voltage perturbation by a phase angle φ. Resistances (e.g. to charge transfer) give a response in phase with the voltage perturbation; capacitances (e.g. double layer) give a response 90° out of phase; combinations of resistances and capacitances give phase angles between 0 and 90°. Plots of the out of phase vs. the in phase component of the impedance for all the frequencies tested are called complex plane (or Nyquist) plots. Plots of the phase angle and the magnitude of the impedance vs. the logarithm of perturbation frequency are called Bode diagrams. Complex plane plots are the more commonly used for electrochemical sensors.
Altlabel	EIS
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q3492904
Label	ElectrochemicalImpedanceSpectroscopy
Formal description
Subclass Of	Impedimetry

ElectrochemicalPiezoelectricMicrogravimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalPiezoelectricMicrogravimetry
Annotations
Preflabel	ElectrochemicalPiezoelectricMicrogravimetry
Elucidation	Electrogravimetry using an electrochemical quartz crystal microbalance. The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made.
Comment	Electrogravimetry using an electrochemical quartz crystal microbalance. The change of mass is, for rigid deposits, linearly proportional to the change of the reso- nance frequency of the quartz crystal, according to the Sauerbrey equation. For non- rigid deposits, corrections must be made.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	ElectrochemicalPiezoelectricMicrogravimetry
Formal description
Subclass Of	Electrogravimetry

ElectrochemicalTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectrochemicalTesting
Annotations
Preflabel	ElectrochemicalTesting
Elucidation	In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity.
Comment	In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity
Comment	In electrochemical characterization, the measurement of potential, charge, or current is used to determine an analyte's concentration or to characterize an analyte's chemical reactivity.
Label	ElectrochemicalTesting
Formal description
Subclass Of	ChargeDistribution

Electrogravimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Electrogravimetry
Annotations
Preflabel	Electrogravimetry
Elucidation	Method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode.
Elucidation	method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode.
Comment	Method of electroanalytical chemistry used to separate by electrolyse ions of a substance and to derive the amount of this substance from the increase in mass of an electrode.
Ievreference	https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-04-14
Wikidatareference	https://www.wikidata.org/wiki/Q902953
Wikipediareference	https://en.wikipedia.org/wiki/Electrogravimetry
Label	Electrogravimetry
Formal description
Subclass Of	ElectrochemicalTesting

ElectronBackscatterDiffraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronBackscatterDiffraction
Annotations
Preflabel	ElectronBackscatterDiffraction
Elucidation	Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.
Comment	Electron backscatter diffraction (EBSD) is a scanning electron microscopy (SEM) technique used to study the crystallographic structure of materials. EBSD is carried out in a scanning electron microscope equipped with an EBSD detector comprising at least a phosphorescent screen, a compact lens and a low-light camera. In this configuration, the SEM incident beam hits the tilted sample. As backscattered electrons leave the sample, they interact with the crystal's periodic atomic lattice planes and diffract according to Bragg's law at various scattering angles before reaching the phosphor screen forming Kikuchi patterns (EBSPs). EBSD spatial resolution depends on many factors, including the nature of the material under study and the sample preparation. Thus, EBSPs can be indexed to provide information about the material's grain structure, grain orientation, and phase at the micro-scale. EBSD is applied for impurities and defect studies, plastic deformation, and statistical analysis for average misorientation, grain size, and crystallographic texture. EBSD can also be combined with energy-dispersive X-ray spectroscopy (EDS), cathodoluminescence (CL), and wavelength-dispersive X-ray spectroscopy (WDS) for advanced phase identification and materials discovery.
Altlabel	EBSD
Label	ElectronBackscatterDiffraction
Formal description
Subclass Of	ScanningElectronMicroscopy
Subclass Of	ScatteringAndDiffraction

ElectronProbeMicroanalysis

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ElectronProbeMicroanalysis
Annotations
Preflabel	ElectronProbeMicroanalysis
Elucidation	Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers.
Comment	Electron probe microanalysis (EPMA) is used for quantitative analysis of the elemental composition of solid specimens at a micrometer scale. The method uses bombardment of the specimen by keV electrons to excite characteristic X-rays from the sample, which are then detected by using wavelength-dispersive (WD) spectrometers.
Label	ElectronProbeMicroanalysis
Formal description
Subclass Of	Microscopy

Ellipsometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Ellipsometry
Annotations
Preflabel	Ellipsometry
Elucidation	Ellipsometry is an optical technique that uses polarised light to probe the dielectric properties of a sample (optical system). The common application of ellipsometry is the analysis of thin films. Through the analysis of the state of polarisation of the light that is reflected from the sample, ellipsometry yields information on the layers that are thinner than the wavelength of the light itself, down to a single atomic layer or less. Depending on what is already known about the sample, the technique can probe a range of properties including layer thickness, morphology, and chemical composition.
Comment	Ellipsometry is an optical technique that uses polarised light to probe the dielectric properties of a sample (optical system). The common application of ellipsometry is the analysis of thin films. Through the analysis of the state of polarisation of the light that is reflected from the sample, ellipsometry yields information on the layers that are thinner than the wavelength of the light itself, down to a single atomic layer or less. Depending on what is already known about the sample, the technique can probe a range of properties including layer thickness, morphology, and chemical composition.
Label	Ellipsometry
Formal description
Subclass Of	OpticalTesting

EnergyDispersiveXraySpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnergyDispersiveXraySpectroscopy
Annotations
Preflabel	EnergyDispersiveXraySpectroscopy
Elucidation	An analytical technique used for the elemental analysis or chemical characterization of a sample.
Comment	An analytical technique used for the elemental analysis or chemical characterization of a sample.
Altlabel	EDS
Altlabel	EDX
Wikidatareference	https://www.wikidata.org/wiki/Q386334
Wikipediareference	https://en.wikipedia.org/wiki/Energy-dispersive_X-ray_spectroscopy
Label	EnergyDispersiveXraySpectroscopy
Formal description
Subclass Of	Spectroscopy

EnvironmentalScanningElectronMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#EnvironmentalScanningElectronMicroscopy
Annotations
Preflabel	EnvironmentalScanningElectronMicroscopy
Elucidation	The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.
Comment	The environmental scanning electron microscope (ESEM) is a scanning electron microscope (SEM) that allows for the option of collecting electron micrographs of specimens that are wet, uncoated, or both by allowing for a gaseous environment in the specimen chamber.
Label	EnvironmentalScanningElectronMicroscopy
Formal description
Subclass Of	Microscopy

Exafs

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Exafs
Annotations
Preflabel	Exafs
Elucidation	Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure (XANES), is a subset of X-ray absorption spectroscopy (XAS). Like other absorption spectroscopies, XAS techniques follow Beer's law. The X-ray absorption coefficient of a material as a function of energy is obtained by directing X-rays of a narrow energy range at a sample, while recording the incident and transmitted x-ray intensity, as the incident x-ray energy is incremented. When the incident x-ray energy matches the binding energy of an electron of an atom within the sample, the number of x-rays absorbed by the sample increases dramatically, causing a drop in the transmitted x-ray intensity. This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because of the high intensity of synchrotron X-ray sources allow the concentration of the absorbing element to reach as low as a few parts per million. Absorption would be undetectable if the source is too weak. Because X-rays are highly penetrating, XAS samples can be gases, solids or liquids.
Comment	Extended X-ray absorption fine structure (EXAFS), along with X-ray absorption near edge structure (XANES), is a subset of X-ray absorption spectroscopy (XAS). Like other absorption spectroscopies, XAS techniques follow Beer's law. The X-ray absorption coefficient of a material as a function of energy is obtained by directing X-rays of a narrow energy range at a sample, while recording the incident and transmitted x-ray intensity, as the incident x-ray energy is incremented. When the incident x-ray energy matches the binding energy of an electron of an atom within the sample, the number of x-rays absorbed by the sample increases dramatically, causing a drop in the transmitted x-ray intensity. This results in an absorption edge. Every element has a set of unique absorption edges corresponding to different binding energies of its electrons, giving XAS element selectivity. XAS spectra are most often collected at synchrotrons because of the high intensity of synchrotron X-ray sources allow the concentration of the absorbing element to reach as low as a few parts per million. Absorption would be undetectable if the source is too weak. Because X-rays are highly penetrating, XAS samples can be gases, solids or liquids.
Label	Exafs
Formal description
Subclass Of	Spectroscopy

FatigueTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#FatigueTesting
Annotations
Preflabel	FatigueTesting
Elucidation	Fatigue testing is a specialised form of mechanical testing that is performed by applying cyclic loading to a coupon or structure. These tests are used either to generate fatigue life and crack growth data, identify critical locations or demonstrate the safety of a structure that may be susceptible to fatigue.
Comment	Fatigue testing is a specialised form of mechanical testing that is performed by applying cyclic loading to a coupon or structure. These tests are used either to generate fatigue life and crack growth data, identify critical locations or demonstrate the safety of a structure that may be susceptible to fatigue.
Label	FatigueTesting
Formal description
Subclass Of	MechanicalTesting

FibDic

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#FibDic
Annotations
Preflabel	FibDic
Elucidation	The FIB-DIC (Focused Ion Beam - Digital Image Correlation) ring-core technique is a powerful method for measuring residual stresses in materials. It is based on milling a ring-shaped sample, or core, from the material of interest using a focused ion beam (FIB).
Comment	The FIB-DIC (Focused Ion Beam - Digital Image Correlation) ring-core technique is a powerful method for measuring residual stresses in materials. It is based on milling a ring-shaped sample, or core, from the material of interest using a focused ion beam (FIB).
Altlabel	FIBDICResidualStressAnalysis
Label	FibDic
Formal description
Subclass Of	MechanicalTesting

FieldEmissionScanningElectronMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#FieldEmissionScanningElectronMicroscopy
Annotations
Preflabel	FieldEmissionScanningElectronMicroscopy
Elucidation	Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging.
Comment	Field emission scanning electron microscopy (FE-SEM) is an advanced technology used to capture the microstructure image of the materials. FE-SEM is typically performed in a high vacuum because gas molecules tend to disturb the electron beam and the emitted secondary and backscattered electrons used for imaging.
Altlabel	FE-SEM
Label	FieldEmissionScanningElectronMicroscopy
Formal description
Subclass Of	Microscopy

FourierTransformInfraredSpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#FourierTransformInfraredSpectroscopy
Annotations
Preflabel	FourierTransformInfraredSpectroscopy
Elucidation	A technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas
Comment	A technique used to obtain an infrared spectrum of absorption or emission of a solid, liquid, or gas
Altlabel	FTIR
Wikidatareference	https://www.wikidata.org/wiki/Q901559
Wikipediareference	https://en.wikipedia.org/wiki/Fourier-transform_infrared_spectroscopy
Label	FourierTransformInfraredSpectroscopy
Formal description
Subclass Of	Spectroscopy

Fractography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Fractography
Annotations
Preflabel	Fractography
Elucidation	Fractography is the study of fracture surfaces in order to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture. Fractography qualitatively interprets the mechanisms of fracture that occur in a sample by microscopic examination of fracture surface morpholog.
Comment	Fractography is the study of fracture surfaces in order to determine the relation between the microstructure and the mechanism(s) of crack initiation and propagation and, eventually, the root cause of the fracture. Fractography qualitatively interprets the mechanisms of fracture that occur in a sample by microscopic examination of fracture surface morpholog.
Label	Fractography
Formal description
Subclass Of	OpticalTesting

FreezingPointDepressionOsmometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#FreezingPointDepressionOsmometry
Annotations
Preflabel	FreezingPointDepressionOsmometry
Elucidation	The general principle of freezing point depression osmometry involves the relationship between the number of moles of dissolved solute in a solution and the change in freezing point.
Comment	The general principle of freezing point depression osmometry involves the relationship between the number of moles of dissolved solute in a solution and the change in freezing point.
Label	FreezingPointDepressionOsmometry
Formal description
Subclass Of	Osmometry

GalvanostaticIntermittentTitrationTechnique

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#GalvanostaticIntermittentTitrationTechnique
Annotations
Preflabel	GalvanostaticIntermittentTitrationTechnique
Elucidation	Electrochemical method that applies current pulses to an electrochemical cell at rest and measures the voltage response.
Comment	Electrochemical method that applies current pulses to an electrochemical cell at rest and measures the voltage response.
Altlabel	GITT
Wikidatareference	https://www.wikidata.org/wiki/Q120906986
Label	GalvanostaticIntermittentTitrationTechnique
Formal description
Subclass Of	Chronopotentiometry

GammaSpectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#GammaSpectrometry
Annotations
Preflabel	GammaSpectrometry
Elucidation	Gamma-ray spectroscopy is the qualitative study of the energy spectra of gamma-ray sources, such as in the nuclear industry, geochemical investigation, and astrophysics.[1] Gamma-ray spectrometry, on the other hand, is the method used to acquire a quantitative spectrum measurement. Most radioactive sources produce gamma rays, which are of various energies and intensities. When these emissions are detected and analyzed with a spectroscopy system, a gamma-ray energy spectrum can be produced. A detailed analysis of this spectrum is typically used to determine the identity and quantity of gamma emitters present in a gamma source, and is a vital tool in radiometric assay. The gamma spectrum is characteristic of the gamma-emitting nuclides contained in the source, just like in an optical spectrometer, the optical spectrum is characteristic of the material contained in a sample.
Comment	Gamma-ray spectroscopy is the qualitative study of the energy spectra of gamma-ray sources, such as in the nuclear industry, geochemical investigation, and astrophysics.[1] Gamma-ray spectrometry, on the other hand, is the method used to acquire a quantitative spectrum measurement. Most radioactive sources produce gamma rays, which are of various energies and intensities. When these emissions are detected and analyzed with a spectroscopy system, a gamma-ray energy spectrum can be produced. A detailed analysis of this spectrum is typically used to determine the identity and quantity of gamma emitters present in a gamma source, and is a vital tool in radiometric assay. The gamma spectrum is characteristic of the gamma-emitting nuclides contained in the source, just like in an optical spectrometer, the optical spectrum is characteristic of the material contained in a sample.
Label	GammaSpectrometry
Formal description
Subclass Of	Spectrometry

GasAdsorptionPorosimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#GasAdsorptionPorosimetry
Annotations
Preflabel	GasAdsorptionPorosimetry
Elucidation	Gas Adsorption Porosimetry is a method used for analyzing the surface area and porosity of materials. In this method, a gas, typically nitrogen or argon, is adsorbed onto the surface of the material at various pressures and temperatures.
Comment	Gas Adsorption Porosimetry is a method used for analyzing the surface area and porosity of materials. In this method, a gas, typically nitrogen or argon, is adsorbed onto the surface of the material at various pressures and temperatures.
Altlabel	GasAdsorptionPorosimetry
Label	GasAdsorptionPorosimetry
Formal description
Subclass Of	Porosimetry

Grinding

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Grinding
Annotations
Preflabel	Grinding
Elucidation	Grinding is a machining process that involves the use of a disc-shaped grinding wheel to remove material from a workpiece. There are several types of grinding wheels, some of which include grindstones, angle grinders, die grinders and specialized grinding machines.
Comment	Grinding is a machining process that involves the use of a disc-shaped grinding wheel to remove material from a workpiece. There are several types of grinding wheels, some of which include grindstones, angle grinders, die grinders and specialized grinding machines.
Label	Grinding
Formal description
Subclass Of	SamplePreparation

HPPC

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#HPPC
Annotations
Preflabel	HPPC
Elucidation	Electrochemical method that measures the voltage drop of a cell resulting from a square wave current load.
Comment	Electrochemical method that measures the voltage drop of a cell resulting from a square wave current load.
Altlabel	HybridPulsePowerCharacterisation
Altlabel	HybridPulsePowerCharacterization
Label	HPPC
Formal description
Subclass Of	Chronopotentiometry

HardnessTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#HardnessTesting
Annotations
Preflabel	HardnessTesting
Elucidation	A test to determine the resistance a material exhibits to permanent deformation by penetration of another harder material.
Comment	A test to determine the resistance a material exhibits to permanent deformation by penetration of another harder material.
Label	HardnessTesting
Formal description
Subclass Of	MechanicalTesting

HardwareManufacturer

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardwareManufacturer
Annotations
Preflabel	HardwareManufacturer
Comment
Label	HardwareManufacturer
Formal description
Subclass Of	CharacterisationHardwareSpecification

HardwareModel

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#CharacterisationHardwareModel
Annotations
Preflabel	HardwareModel
Comment
Label	HardwareModel
Formal description
Subclass Of	CharacterisationHardwareSpecification

Hazard

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Hazard
Annotations
Preflabel	Hazard
Elucidation	Set of inherent properties of a substance, mixture of substances, or a process involving substances that, under production, usage, or disposal conditions, make it capable of causing adverse effects to organisms or the environment, depending on the degree of exposure; in other words, it is a source of danger.
Comment	Set of inherent properties of a substance, mixture of substances, or a process involving substances that, under production, usage, or disposal conditions, make it capable of causing adverse effects to organisms or the environment, depending on the degree of exposure; in other words, it is a source of danger.
Label	Hazard
Formal description
Subclass Of	Property

Holder

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Holder
Annotations
Preflabel	Holder
Elucidation	An object which supports the specimen in the correct position for the characterisation process.
Comment	An object which supports the specimen in the correct position for the characterisation process.
Label	Holder
Formal description
Subclass Of	CharacterisationHardware

HydrodynamicVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#HydrodynamicVoltammetry
Annotations
Preflabel	HydrodynamicVoltammetry
Elucidation	Voltammetry with forced flow of the solution towards the electrode surface. A linear potential scan, at sufficiently slow scan rates so as to ensure a steady state response, is usually applied. Mass transport of a redox species enhanced by convection in this way results in a greater electric current. Convective mass transfer occurs up to the diffusion-limiting layer, within which the mass transfer is controlled by diffusion. Electroactive substance depletion outside the diffusion layer is annulled by convective mass transfer, which results in steady- state sigmoidal wave-shaped current-potential curves. The forced flow can be accomplished by movement either of the solution (solution stirring, or channel flow), or of the electrode (electrode rotation or vibration).
Comment	Voltammetry with forced flow of the solution towards the electrode surface. A linear potential scan, at sufficiently slow scan rates so as to ensure a steady state response, is usually applied. Mass transport of a redox species enhanced by convection in this way results in a greater electric current. Convective mass transfer occurs up to the diffusion-limiting layer, within which the mass transfer is controlled by diffusion. Electroactive substance depletion outside the diffusion layer is annulled by convective mass transfer, which results in steady- state sigmoidal wave-shaped current-potential curves. The forced flow can be accomplished by movement either of the solution (solution stirring, or channel flow), or of the electrode (electrode rotation or vibration).
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q17028237
Wikipediareference	https://en.wikipedia.org/wiki/Hydrodynamic_voltammetry
Label	HydrodynamicVoltammetry
Formal description
Subclass Of	Voltammetry

ICI

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ICI
Annotations
Preflabel	ICI
Elucidation	Electrochemical method that measures the voltage response of an electrochemical cell under galvanostatic conditions to short interruptions in the current.
Comment	Electrochemical method that measures the voltage response of an electrochemical cell under galvanostatic conditions to short interruptions in the current.
Altlabel	IntermittentCurrentInterruptionMethod
Label	ICI
Formal description
Subclass Of	Chronopotentiometry

Impedimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Impedimetry
Annotations
Preflabel	Impedimetry
Elucidation	Measurement principle in which the complex electric impedance of a system is measured, usually as a function of a small amplitude sinusoidal electrode potential.
Comment	Measurement principle in which the complex electric impedance of a system is measured, usually as a function of a small amplitude sinusoidal electrode potential.
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	Impedimetry
Formal description
Subclass Of	ElectrochemicalTesting

InteractionVolume

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#InteractionVolume
Annotations
Preflabel	InteractionVolume
Elucidation	The volume of material, and the surrounding environment, that interacts with the probe and generate a detectable (measurable) signal (information).
Comment	In some cases, (like tribological characterisations) the “sample” can also be the “probe”. When analysing a system of samples that interact each other, finding a clear definition can become a complex problem. It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal.
Comment	In some cases, (like tribological characterisations) the “sample” can also be the “probe”. When analysing a system of samples that interact each other, finding a clear definition can become a complex problem. It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal.
Comment	The volume of material, and the surrounding environment, that interacts with the probe and generate a detectable (measurable) signal (information).
Comment	The volume of material, and the surrounding environment, that interacts with the probe and generate a detectable (measurable) signal (information). In Scanning Electron Microscopy (SEM), the interaction volume is the volume of material that interacts directly with the incident electron beam, is usually much smaller than the entire specimen’s volume, and can be computed by using proper models. The interaction between the scanning probe and the sample generates a series of detectable signals (back scattered electrons, secondary electrons, x-rays, specimen current, etc.) which contain information on sample morphology, microstructure, composition, etc. In x-ray diffraction, the interaction volume is the volume of material that interacts directly with the x-ray beam and is usually smaller than the volume of the entire specimen. Depending on sample’s structure and microstructure, the interaction between the sample and the x-ray incident beam generates a secondary (reflected) beam that is measured by a detector and contains information on certain sample’s properties (e.g., crystallographic structure, phase composition, grain size, residual stress...). In some cases, (like tribological characterisations) the “sample” can also be the “probe”. When analysing a system of samples that interact each other, finding a clear definition can become a complex problem. It is important to note that, in some cases, the volume of interaction could be different from the volume of detectable signal emission. Example: in Scanning Electron Microscopy (SEM), the volume of interaction between the electron probe and the material is different from the volumes that generate the captured signal.
Example	In Scanning Electron Microscopy (SEM), the interaction volume is the volume of material that interacts directly with the incident electron beam, is usually much smaller than the entire specimen’s volume, and can be computed by using proper models. The interaction between the scanning probe and the sample generates a series of detectable signals (back scattered electrons, secondary electrons, x-rays, specimen current, etc.) which contain information on sample morphology, microstructure, composition, etc. In x-ray diffraction, the interaction volume is the volume of material that interacts directly with the x-ray beam and is usually smaller than the volume of the entire specimen. Depending on sample’s structure and microstructure, the interaction between the sample and the x-ray incident beam generates a secondary (reflected) beam that is measured by a detector and contains information on certain sample’s properties (e.g., crystallographic structure, phase composition, grain size, residual stress...).
Label	InteractionVolume
Formal description
Subclass Of	Object

IntermediateSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#IntermediateSample
Annotations
Preflabel	IntermediateSample
Comment
Label	IntermediateSample
Formal description
Subclass Of	Sample

IonChromatography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#IonChromatography
Annotations
Preflabel	IonChromatography
Elucidation	Ion chromatography (or ion-exchange chromatography) is a form of chromatography that separates ions and ionizable polar molecules based on their affinity to the ion exchanger.
Comment	Ion chromatography (or ion-exchange chromatography) is a form of chromatography that separates ions and ionizable polar molecules based on their affinity to the ion exchanger.
Wikipediareference	https://en.wikipedia.org/wiki/Ion_chromatography
Label	IonChromatography
Formal description
Subclass Of	Chromatography

IonMobilitySpectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#IonMobilitySpectrometry
Annotations
Preflabel	IonMobilitySpectrometry
Elucidation	Ion mobility spectrometry (IMS) It is a method of conducting analytical research that separates and identifies ionized molecules present in the gas phase based on the mobility of the molecules in a carrier buffer gas. Even though it is used extensively for military or security objectives, such as detecting drugs and explosives, the technology also has many applications in laboratory analysis, including studying small and big biomolecules. IMS instruments are extremely sensitive stand-alone devices, but are often coupled with mass spectrometry, gas chromatography or high-performance liquid chromatography in order to achieve a multi-dimensional separation. They come in various sizes, ranging from a few millimeters to several meters depending on the specific application, and are capable of operating under a broad range of conditions. IMS instruments such as microscale high-field asymmetric-waveform ion mobility spectrometry can be palm-portable for use in a range of applications including volatile organic compound (VOC) monitoring, biological sample analysis, medical diagnosis and food quality monitoring.
Comment	Ion mobility spectrometry (IMS) It is a method of conducting analytical research that separates and identifies ionized molecules present in the gas phase based on the mobility of the molecules in a carrier buffer gas. Even though it is used extensively for military or security objectives, such as detecting drugs and explosives, the technology also has many applications in laboratory analysis, including studying small and big biomolecules. IMS instruments are extremely sensitive stand-alone devices, but are often coupled with mass spectrometry, gas chromatography or high-performance liquid chromatography in order to achieve a multi-dimensional separation. They come in various sizes, ranging from a few millimeters to several meters depending on the specific application, and are capable of operating under a broad range of conditions. IMS instruments such as microscale high-field asymmetric-waveform ion mobility spectrometry can be palm-portable for use in a range of applications including volatile organic compound (VOC) monitoring, biological sample analysis, medical diagnosis and food quality monitoring.
Altlabel	IMS
Label	IonMobilitySpectrometry
Formal description
Subclass Of	Spectrometry

IsothermalMicrocalorimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#IsothermalMicrocalorimetry
Annotations
Preflabel	IsothermalMicrocalorimetry
Elucidation	Isothermal microcalorimetry (IMC) is a laboratory method for real-time monitoring and dynamic analysis of chemical, physical and biological processes. Over a period of hours or days, IMC determines the onset, rate, extent and energetics of such processes for specimens in small ampoules (e.g. 3–20 ml) at a constant set temperature (c. 15 °C–150 °C). IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed time the net rate of heat flow (μJ/s = μW) to or from the specimen ampoule, and the cumulative amount of heat (J) consumed or produced.
Comment	Isothermal microcalorimetry (IMC) is a laboratory method for real-time monitoring and dynamic analysis of chemical, physical and biological processes. Over a period of hours or days, IMC determines the onset, rate, extent and energetics of such processes for specimens in small ampoules (e.g. 3–20 ml) at a constant set temperature (c. 15 °C–150 °C). IMC accomplishes this dynamic analysis by measuring and recording vs. elapsed time the net rate of heat flow (μJ/s = μW) to or from the specimen ampoule, and the cumulative amount of heat (J) consumed or produced.
Altlabel	IMC
Label	IsothermalMicrocalorimetry
Formal description
Subclass Of	ThermochemicalTesting

Laboratory

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Laboratory
Annotations
Preflabel	Laboratory
Elucidation	The laboratory where the whole characterisation process or some of its stages take place.
Comment	The laboratory where the whole characterisation process or some of its stages take place.
Label	Laboratory
Formal description
Subclass Of	Thing

LevelOfAutomation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#LevelOfAutomation
Annotations
Preflabel	LevelOfAutomation
Elucidation	Describes the level of automation of the test.
Comment	Describes the level of automation of the test.
Label	LevelOfAutomation
Formal description
Subclass Of	NominalProperty

LevelOfExpertise

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#LevelOfExpertise
Annotations
Preflabel	LevelOfExpertise
Elucidation	Describes the level of expertise required to carry out a process (the entire test or the data processing).
Comment	Describes the level of expertise required to carry out a process (the entire test or the data processing).
Label	LevelOfExpertise
Formal description
Subclass Of	NominalProperty

LightScattering

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#LightScattering
Annotations
Preflabel	LightScattering
Elucidation	Light scattering is the way light behaves when it interacts with a medium that contains particles or the boundary between different mediums where defects or structures are present. It is different than the effects of refraction, where light undergoes a change in index of refraction as it passes from one medium to another, or reflection, where light reflects back into the same medium, both of which are governed by Snell’s law. Light scattering can be caused by factors such as the nature, texture, or specific structures of a surface and the presence of gas, liquid, or solid particles through which light propagates, as well as the nature of the light itself, of its wavelengths and polarization states. It usually results in diffuse light and can also affect the dispersion of color.
Comment	Light scattering is the way light behaves when it interacts with a medium that contains particles or the boundary between different mediums where defects or structures are present. It is different than the effects of refraction, where light undergoes a change in index of refraction as it passes from one medium to another, or reflection, where light reflects back into the same medium, both of which are governed by Snell’s law. Light scattering can be caused by factors such as the nature, texture, or specific structures of a surface and the presence of gas, liquid, or solid particles through which light propagates, as well as the nature of the light itself, of its wavelengths and polarization states. It usually results in diffuse light and can also affect the dispersion of color.
Label	LightScattering
Formal description
Subclass Of	OpticalTesting

LinearChronopotentiometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#LinearChronopotentiometry
Annotations
Preflabel	LinearChronopotentiometry
Elucidation	Chronopotentiometry where the applied current is changed linearly.
Elucidation	chronopotentiometry where the applied current is changed linearly
Comment	Chronopotentiometry where the applied current is changed linearly.
Label	LinearChronopotentiometry
Formal description
Subclass Of	Chronopotentiometry

LinearScanVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#LinearScanVoltammetry
Annotations
Preflabel	LinearScanVoltammetry
Elucidation	Voltammetry in which the current is recorded as the electrode potential is varied linearly with time. LSV corresponds to the first half cycle of cyclic voltammetry. The peak current is expressed by the Randles-Ševčík equation. The scan is usually started at a potential where no electrode reaction occurs.
Comment	Voltammetry in which the current is recorded as the electrode potential is varied linearly with time. LSV corresponds to the first half cycle of cyclic voltammetry. The peak current is expressed by the Randles-Ševčík equation. The scan is usually started at a potential where no electrode reaction occurs.
Altlabel	LSV
Altlabel	LinearPolarization
Altlabel	LinearSweepVoltammetry
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q620700
Wikipediareference	https://en.wikipedia.org/wiki/Linear_sweep_voltammetry
Label	LinearScanVoltammetry
Formal description
Subclass Of	Voltammetry

MassSpectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MassSpectrometry
Annotations
Preflabel	MassSpectrometry
Elucidation	Mass spectrometry is a powerful analytical technique used to quantify known materials, to identify unknown compounds within a sample, and to elucidate the structure and chemical properties of different molecules.
Comment	Mass spectrometry is a powerful analytical technique used to quantify known materials, to identify unknown compounds within a sample, and to elucidate the structure and chemical properties of different molecules.
Label	MassSpectrometry
Formal description
Subclass Of	Spectrometry

MeasurementParameter

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementParameter
Annotations
Preflabel	MeasurementParameter
Elucidation	Describes the main input parameters that are needed to acquire the signal.
Comment	Describes the main input parameters that are needed to acquire the signal.
Comment	Describes the main input parameters that are needed to acquire the signal.
Label	MeasurementParameter
Formal description
Subclass Of	Parameter

MeasurementSystemAdjustment

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementSystemAdjustment
Annotations
Preflabel	MeasurementSystemAdjustment
Elucidation	Activity which has the goal of adjusting/tuning a measing instrument, without performing a measurement on a reference sample (which is a calibration). The output of this process can be a specific measurement parameter to be used in the characteriasation measurement process.
Comment	Activity which has the goal of adjusting/tuning a measing instrument, without performing a measurement on a reference sample (which is a calibration). The output of this process can be a specific measurement parameter to be used in the characteriasation measurement process.
Comment	From the International Vocabulary of Metrology (VIM): Set of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity being measured. NOTE 1: If there is any doubt that the context in which the term is being used is that of metrology, the long form “adjustment of a measuring system” might be used. NOTE 2: Types of adjustment of a measuring system include zero adjustment, offset adjustment, and span adjustment (sometimes called “gain adjustment”). NOTE 3: Adjustment of a measuring system should not be confused with calibration, which is sometimes a prerequisite for adjustment. NOTE 4: After an adjustment of a measuring system, the measuring system must usually be recalibrated.
Comment	Activity which has the goal of adjusting/tuning a measing instrument, without performing a measurement on a reference sample (which is a calibration). The output of this process can be a specific measurement parameter to be used in the characteriasation measurement process. From the International Vocabulary of Metrology (VIM): Set of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity being measured. NOTE 1: If there is any doubt that the context in which the term is being used is that of metrology, the long form “adjustment of a measuring system” might be used. NOTE 2: Types of adjustment of a measuring system include zero adjustment, offset adjustment, and span adjustment (sometimes called “gain adjustment”). NOTE 3: Adjustment of a measuring system should not be confused with calibration, which is sometimes a prerequisite for adjustment. NOTE 4: After an adjustment of a measuring system, the measuring system must usually be recalibrated.
Altlabel	MeasurementParameterAdjustment
Vimterm	Adjustment
Definition	From the International Vocabulary of Metrology (VIM): Set of operations carried out on a measuring system so that it provides prescribed indications corresponding to given values of a quantity being measured. NOTE 1: If there is any doubt that the context in which the term is being used is that of metrology, the long form “adjustment of a measuring system” might be used. NOTE 2: Types of adjustment of a measuring system include zero adjustment, offset adjustment, and span adjustment (sometimes called “gain adjustment”). NOTE 3: Adjustment of a measuring system should not be confused with calibration, which is sometimes a prerequisite for adjustment. NOTE 4: After an adjustment of a measuring system, the measuring system must usually be recalibrated.
Label	MeasurementSystemAdjustment
Formal description
Subclass Of	CharacterisationProcedure
Subclass Of	hasOutput some MeasurementParameter

MeasurementTime

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MeasurementTime
Annotations
Preflabel	MeasurementTime
Elucidation	The overall time needed to acquire the measurement data.
Comment	The overall time needed to acquire the measurement data.
Comment	The overall time needed to acquire the measurement data.
Label	MeasurementTime
Formal description
Subclass Of	Property

MechanicalTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MechanicalTesting
Annotations
Preflabel	MechanicalTesting
Elucidation	Mechanical testing covers a wide range of tests, which can be divided broadly into two types: 1. those that aim to determine a material's mechanical properties, independent of geometry; 2. those that determine the response of a structure to a given action, e.g. testing of composite beams, aircraft structures to destruction, etc.
Comment	Mechanical testing covers a wide range of tests, which can be divided broadly into two types: 1. those that aim to determine a material's mechanical properties, independent of geometry; 2. those that determine the response of a structure to a given action, e.g. testing of composite beams, aircraft structures to destruction, etc.
Wikipediareference	https://en.wikipedia.org/wiki/Mechanical_testing
Label	MechanicalTesting
Formal description
Subclass Of	CharacterisationTechnique

MembraneOsmometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MembraneOsmometry
Annotations
Preflabel	MembraneOsmometry
Elucidation	In the membrane osmometry technique, a pure solvent and polymer solution are separated by a semipermeable membrane, due to the higher chemical potential of the solvent in the pure solvent than in polymer solution, the solvent starts moving towards the polymer solution.
Comment	In the membrane osmometry technique, a pure solvent and polymer solution are separated by a semipermeable membrane, due to the higher chemical potential of the solvent in the pure solvent than in polymer solution, the solvent starts moving towards the polymer solution.
Comment	In the membrane osmometry technique, a pure solvent and polymer solution are separated by a semipermeable membrane, due to the higher chemical potential of the solvent in the pure solvent than in polymer solution, the solvent starts moving towards the polymer solution.
Label	MembraneOsmometry
Formal description
Subclass Of	Osmometry

MercuryPorosimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#MercuryPorosimetry
Annotations
Preflabel	MercuryPorosimetry
Elucidation	A method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion.
Comment	A method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion.
Comment	A method used to measure the pore size distribution and total pore volume of solid materials by infiltrating mercury into the pores under controlled pressure conditions and analyzing the amount of mercury intrusion.
Label	MercuryPorosimetry
Formal description
Subclass Of	Porosimetry

Microscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Microscopy
Annotations
Preflabel	Microscopy
Elucidation	Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales.
Comment	Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales.
Comment	Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales.
Label	Microscopy
Formal description
Subclass Of	CharacterisationTechnique

Milling

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Milling
Annotations
Preflabel	Milling
Elucidation	Milling is a machining process that involves the use of a milling machine to remove material from a workpiece. Milling machines feature cutting blades that rotate while they press against the workpiece.
Comment	Milling is a machining process that involves the use of a milling machine to remove material from a workpiece. Milling machines feature cutting blades that rotate while they press against the workpiece.
Label	Milling
Formal description
Subclass Of	SamplePreparation

Mounting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Mounting
Annotations
Preflabel	Mounting
Elucidation	The sample is mounted on a holder.
Comment	The sample is mounted on a holder.
Comment	The sample is mounted on a holder.
Label	Mounting
Formal description
Subclass Of	SamplePreparation
Subclass Of	hasTemporaryParticipant some Holder

Nanoindentation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Nanoindentation
Annotations
Preflabel	Nanoindentation
Elucidation	Nanoindentation (known also as nanoindentation test) is a method for testing the hardness and related mechanical properties of materials, facilitated by high-precision instrumentation in the nanometer scale, as well as analytical and computational algorithms for result evaluation.
Comment	Nanoindentation (known also as nanoindentation test) is a method for testing the hardness and related mechanical properties of materials, facilitated by high-precision instrumentation in the nanometer scale, as well as analytical and computational algorithms for result evaluation.
Comment	Nanoindentation (known also as nanoindentation test) is a method for testing the hardness and related mechanical properties of materials, facilitated by high-precision instrumentation in the nanometer scale, as well as analytical and computational algorithms for result evaluation. By definition, when someone performs nanoindentation, it refers to either quasistatic or continuous stiffness measurement. However, in reality with a nanoindenter it is also possible to perform scratch testing, scanning probe microscopy, and apply non-contact surface energy mapping, which can also be called nanoindentation, because they are measurements conducted using an nanoindenter.
Example	By definition, when someone performs nanoindentation, it refers to either quasistatic or continuous stiffness measurement. However, in reality with a nanoindenter it is also possible to perform scratch testing, scanning probe microscopy, and apply non-contact surface energy mapping, which can also be called nanoindentation, because they are measurements conducted using an nanoindenter.
Label	Nanoindentation
Formal description
Subclass Of	MechanicalTesting

NeutronSpinEchoSpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#NeutronSpinEchoSpectroscopy
Annotations
Preflabel	NeutronSpinEchoSpectroscopy
Elucidation	Neutron spin echo spectroscopy is a high resolution inelastic neutron scattering method probing nanosecond dynamics. Neutron spin echo (NSE) spectroscopy uses the precession of neutron spins in a magnetic field to measure the energy transfer at the sample and decouples the energy resolution from beam characteristics like monochromatisation and collimation.
Comment	Neutron spin echo spectroscopy is a high resolution inelastic neutron scattering method probing nanosecond dynamics. Neutron spin echo (NSE) spectroscopy uses the precession of neutron spins in a magnetic field to measure the energy transfer at the sample and decouples the energy resolution from beam characteristics like monochromatisation and collimation.
Altlabel	NSE
Label	NeutronSpinEchoSpectroscopy
Formal description
Subclass Of	Spectroscopy

Nexafs

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Nexafs
Annotations
Preflabel	Nexafs
Elucidation	Near edge X-ray absorption fine structure (NEXAFS), also known as X-ray absorption near edge structure (XANES), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms.
Comment	Near edge X-ray absorption fine structure (NEXAFS), also known as X-ray absorption near edge structure (XANES), is a type of absorption spectroscopy that indicates the features in the X-ray absorption spectra (XAS) of condensed matter due to the photoabsorption cross section for electronic transitions from an atomic core level to final states in the energy region of 50–100 eV above the selected atomic core level ionization energy, where the wavelength of the photoelectron is larger than the interatomic distance between the absorbing atom and its first neighbour atoms.
Label	Nexafs
Formal description
Subclass Of	Spectroscopy

NormalPulseVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#NormalPulseVoltammetry
Annotations
Preflabel	NormalPulseVoltammetry
Elucidation	Voltammetry in which potential pulses of amplitude increasing by a constant increment and with a pulse width of 2 to 200 ms are superimposed on a constant initial potential. Normal pulse polarography is NPV in which a dropping mercury electrode is used as the working electrode. A pulse is applied just before the mechanically enforced end of the drop. The pulse width is usually 10 to 20 % of the drop time. The drop dislodgment is synchro- nized with current sampling, which is carried out just before the end of the pulse, as in NPV. Sigmoidal wave-shaped voltammograms are obtained. The current is sampled at the end of the pulse and then plotted versus the potential of the pulse. The current is sampled just before the end of the pulse, when the charging current is greatly diminished. In this way, the ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detec- tion is lowered. The sensitivity of NPV is not affected by the reversibility of the electrode reaction of the analyte.
Comment	Voltammetry in which potential pulses of amplitude increasing by a constant increment and with a pulse width of 2 to 200 ms are superimposed on a constant initial potential. Normal pulse polarography is NPV in which a dropping mercury electrode is used as the working electrode. A pulse is applied just before the mechanically enforced end of the drop. The pulse width is usually 10 to 20 % of the drop time. The drop dislodgment is synchro- nized with current sampling, which is carried out just before the end of the pulse, as in NPV. Sigmoidal wave-shaped voltammograms are obtained. The current is sampled at the end of the pulse and then plotted versus the potential of the pulse. The current is sampled just before the end of the pulse, when the charging current is greatly diminished. In this way, the ratio of faradaic current to charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detec- tion is lowered. The sensitivity of NPV is not affected by the reversibility of the electrode reaction of the analyte.
Altlabel	NPV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	NormalPulseVoltammetry
Formal description
Subclass Of	Voltammetry

NuclearMagneticResonance

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#NuclearMagneticResonance
Annotations
Preflabel	NuclearMagneticResonance
Elucidation	Nuclear magnetic resonance spectroscopy, most commonly known as NMR spectroscopy or magnetic resonance spectroscopy (MRS), is a spectroscopic technique to observe local magnetic fields around atomic nuclei. This spectroscopy is based on the measurement of absorption of electromagnetic radiations in the radio frequency region from roughly 4 to 900 MHz. Absorption of radio waves in the presence of magnetic field is accompanied by a special type of nuclear transition, and for this reason, such type of spectroscopy is known as Nuclear Magnetic Resonance Spectroscopy. The sample is placed in a magnetic field and the NMR signal is produced by excitation of the nuclei sample with radio waves into nuclear magnetic resonance, which is detected with sensitive radio receivers. The intramolecular magnetic field around an atom in a molecule changes the resonance frequency, thus giving access to details of the electronic structure of a molecule and its individual functional groups. As the fields are unique or highly characteristic to individual compounds, in modern organic chemistry practice, NMR spectroscopy is the definitive method to identify monomolecular organic compounds.
Comment	Nuclear magnetic resonance spectroscopy, most commonly known as NMR spectroscopy or magnetic resonance spectroscopy (MRS), is a spectroscopic technique to observe local magnetic fields around atomic nuclei. This spectroscopy is based on the measurement of absorption of electromagnetic radiations in the radio frequency region from roughly 4 to 900 MHz. Absorption of radio waves in the presence of magnetic field is accompanied by a special type of nuclear transition, and for this reason, such type of spectroscopy is known as Nuclear Magnetic Resonance Spectroscopy. The sample is placed in a magnetic field and the NMR signal is produced by excitation of the nuclei sample with radio waves into nuclear magnetic resonance, which is detected with sensitive radio receivers. The intramolecular magnetic field around an atom in a molecule changes the resonance frequency, thus giving access to details of the electronic structure of a molecule and its individual functional groups. As the fields are unique or highly characteristic to individual compounds, in modern organic chemistry practice, NMR spectroscopy is the definitive method to identify monomolecular organic compounds.
Altlabel	Magnetic resonance spectroscopy (MRS)
Altlabel	NMR
Label	NuclearMagneticResonance
Formal description
Subclass Of	Spectroscopy

OpenCircuitHold

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpenCircuitHold
Annotations
Preflabel	OpenCircuitHold
Elucidation	A process in which the electric current is kept constant at 0 (i.e., open-circuit conditions).
Comment	A process in which the electric current is kept constant at 0 (i.e., open-circuit conditions).
Altlabel	OCVHold
Label	OpenCircuitHold
Formal description
Subclass Of	Potentiometry

Operator

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Operator
Annotations
Preflabel	Operator
Elucidation	The human operator who takes care of the whole characterisation method or sub-processes/stages.
Comment	The human operator who takes care of the whole characterisation method or sub-processes/stages.
Label	Operator
Formal description
Subclass Of	Person
Subclass Of	IntentionalAgent
Subclass Of	Person and IntentionalAgent

OpticalMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpticalMicroscopy
Annotations
Preflabel	OpticalMicroscopy
Elucidation	Optical microscopy is a technique used to closely view a sample through the magnification of a lens with visible light.
Comment	Optical microscopy is a technique used to closely view a sample through the magnification of a lens with visible light.
Label	OpticalMicroscopy
Formal description
Subclass Of	Microscopy

OpticalTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#OpticalTesting
Annotations
Preflabel	OpticalTesting
Comment
Label	OpticalTesting
Formal description
Subclass Of	CharacterisationTechnique

Osmometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Osmometry
Annotations
Preflabel	Osmometry
Elucidation	Osmometry is an advanced analytical method for determining the osmotic concentration of solutions. The osmotic – or solute – concentration of a colloidal system is expressed in osmoles (Osm) per unit of volume (Osm/L) or weight (Osm/kg).
Comment	Osmometry is an advanced analytical method for determining the osmotic concentration of solutions. The osmotic – or solute – concentration of a colloidal system is expressed in osmoles (Osm) per unit of volume (Osm/L) or weight (Osm/kg).
Label	Osmometry
Formal description
Subclass Of	CharacterisationTechnique

OutlierRemoval

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#OutlierRemoval
Annotations
Preflabel	OutlierRemoval
Elucidation	Outlier removal refers to the process of identifying and eliminating anomalous data points that deviate significantly from the overall pattern of a dataset. These outliers are generally considered to be observations that are unusually distant from other values and can potentially distort the results of analyses.
Comment	Outlier removal refers to the process of identifying and eliminating anomalous data points that deviate significantly from the overall pattern of a dataset. These outliers are generally considered to be observations that are unusually distant from other values and can potentially distort the results of analyses.
Comment
Label	OutlierRemoval
Formal description
Subclass Of	DataFiltering

PhotoluminescenceMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PhotoluminescenceMicroscopy
Annotations
Preflabel	PhotoluminescenceMicroscopy
Elucidation	Photoluminescence spectroscopy is a widely used technique for characterisation of the optical and electronic properties of semiconductors and molecules.
Comment	Photoluminescence spectroscopy is a widely used technique for characterisation of the optical and electronic properties of semiconductors and molecules.
Label	PhotoluminescenceMicroscopy
Formal description
Subclass Of	Microscopy

PhysicsOfInteraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PhysicsOfInteraction
Annotations
Preflabel	PhysicsOfInteraction
Elucidation	Set of physics principles (and associated governing equations) that describes the interaction between the sample and the probe.
Comment	Set of physics principles (and associated governing equations) that describes the interaction between the sample and the probe.
Comment	Set of physics principles (and associated governing equations) that describes the interaction between the sample and the probe. In x-ray diffraction, this is represented by the set of physics equations that describe the relation between the incident x-ray beam and the diffracted beam (the most simple form for this being the Bragg’s law).
Example	In x-ray diffraction, this is represented by the set of physics equations that describe the relation between the incident x-ray beam and the diffracted beam (the most simple form for this being the Bragg’s law).
Label	PhysicsOfInteraction
Formal description
Subclass Of	Thing
Subclass Of	PhysicsEquation or Theory

Polishing

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Polishing
Annotations
Preflabel	Polishing
Elucidation	Polishing is a machining process to achieve a smooth surface of the Sample, which uses abrasive compounds with smal particles that are embedded in a pad or wheel.
Comment	Polishing is a machining process to achieve a smooth surface of the Sample, which uses abrasive compounds with smal particles that are embedded in a pad or wheel.
Label	Polishing
Formal description
Subclass Of	SamplePreparation

Porosimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Porosimetry
Annotations
Preflabel	Porosimetry
Comment
Label	Porosimetry
Formal description
Subclass Of	CharacterisationTechnique

PostProcessingModel

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PostProcessingModel
Annotations
Preflabel	PostProcessingModel
Elucidation	Mathematical model used to process data.
Comment	The PostProcessingModel use is mainly intended to get secondary data from primary data.
Comment	Mathematical model used to process data.
Comment	Mathematical model used to process data. The PostProcessingModel use is mainly intended to get secondary data from primary data.
Comment	The PostProcessingModel use is mainly intended to get secondary data from primary data.
Label	PostProcessingModel
Formal description
Subclass Of	MathematicalModel

PotentiometricStrippingAnalysis

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PotentiometricStrippingAnalysis
Annotations
Preflabel	PotentiometricStrippingAnalysis
Elucidation	Two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential. Historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury. The accumulation is similar to that used in stripping voltammetry. The stripping potentiogram shows staircase curves of potential as a function of time. Frequently, the first derivative is displayed (dE/dt=f(t)), as this produces peak-shaped signals. The time between transitions (peaks) is proportional to the concentration of analyte in the test solution. The time between changes in potential in step 2 is related to the concentration of analyte in the solution.
Elucidation	two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential
Comment	Two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the material is removed by chemical reaction or electrochemically at constant current with measurement of electrode potential. Historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury. The accumulation is similar to that used in stripping voltammetry. The stripping potentiogram shows staircase curves of potential as a function of time. Frequently, the first derivative is displayed (dE/dt=f(t)), as this produces peak-shaped signals. The time between transitions (peaks) is proportional to the concentration of analyte in the test solution. The time between changes in potential in step 2 is related to the concentration of analyte in the solution.
Comment	historically for the analysis of metal ions, mercury ions were added to the test solution to form a mercury amalgam when reduced. Alternatively, an HMDE or MFE was used and the oxidizing agent added after amalgam formation. However, the toxicity of mercury and its compounds have all but precluded the present-day use of mercury
Comment	the accumulation is similar to that used in stripping voltammetry
Comment	the stripping potentiogram shows staircase curves of potential as a function of time. Frequently, the first derivative is displayed (dE/dt=f(t)), as this produces peak-shaped signals. The time between transitions (peaks) is proportional to the concentration of analyte in the test solution
Comment	the time between changes in potential in step 2 is related to the concentration of analyte in the solution
Altlabel	PSA
Label	PotentiometricStrippingAnalysis
Formal description
Subclass Of	Voltammetry

Potentiometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Potentiometry
Annotations
Preflabel	Potentiometry
Elucidation	Method of electroanalytical chemistry based on measurement of an electrode potential. Potentiometric methods are used to measure the electrochemical potentials of a metallic structure in a given environment. For measurements using ion-selective electrodes, the measurement is made under equilibrium conditions what means that the macroscopic electric current is zero and the concentrations of all species are uniform throughout the solution. The indicator electrode is in direct contact with the analyte solution, whereas the reference electrode is usually separated from the analyte solution by a salt bridge. The potential difference between the indicator and reference electrodes is normally directly proportional to the logarithm of the activity (concentration) of the analyte in the solution (Nernst equation). See also ion selective electrode.
Comment	Method of electroanalytical chemistry based on measurement of an electrode potential. Potentiometric methods are used to measure the electrochemical potentials of a metallic structure in a given environment. For measurements using ion-selective electrodes, the measurement is made under equilibrium conditions what means that the macroscopic electric current is zero and the concentrations of all species are uniform throughout the solution. The indicator electrode is in direct contact with the analyte solution, whereas the reference electrode is usually separated from the analyte solution by a salt bridge. The potential difference between the indicator and reference electrodes is normally directly proportional to the logarithm of the activity (concentration) of the analyte in the solution (Nernst equation). See also ion selective electrode.
Ievreference	https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-04-12
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q900632
Label	Potentiometry
Formal description
Subclass Of	ElectrochemicalTesting

PreparedSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PreparedSample
Annotations
Preflabel	PreparedSample
Elucidation	The sample after a preparation process.
Comment	The sample after a preparation process.
Label	PreparedSample
Formal description
Subclass Of	Sample

PrimaryData

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PrimaryData
Annotations
Preflabel	PrimaryData
Elucidation	Data resulting of a pre-processing of raw data, applying corrections to normalize/harmonize, in order to prepare them for the post-processing.
Comment	Data resulting of a pre-processing of raw data, applying corrections to normalize/harmonize, in order to prepare them for the post-processing.
Example	Baseline subtraction, noise reduction , X and Y axes correction.
Label	PrimaryData
Formal description
Subclass Of	CharacterisationData

Probe

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Probe
Annotations
Preflabel	Probe
Elucidation	Probe is the physical tool (i.e., a disturbance, primary solicitation, or a gadget), controlled over time, that generates measurable fields that interact with the sample to acquire information on the specimen’s behaviour and properties.
Comment	Probe is the physical tool (i.e., a disturbance, primary solicitation, or a gadget), controlled over time, that generates measurable fields that interact with the sample to acquire information on the specimen’s behaviour and properties.
Comment
Example	In dynamic light scattering, temporal fluctuations of backscattered light due to Brownian motion and flow of nanoparticles are the probe, resolved as function of pathlength in the sample. From fluctuation analysis (intensity correlations) and the wavelength of light in the medium, the (distribution of) diffusion coefficient(s) can be measured during flow. The Stokes-Einstein relation yields the particle size characteristics.
Example	In electron microscopy (SEM or TEM), the probe is a beam of electrons with known energy that is focused (and scanned) on the sample’s surface with a well-defined beam-size and scanning algorithm.
Example	In mechanical testing, the probe is a the tip plus a force actuator, which is designed to apply a force over-time on a sample. Many variants can be defined depending on way the force is applied (tensile/compressive uniaxial tests, bending test, indentation test) and its variation with time (static tests, dynamic/cyclic tests, impact tests, etc…)
Example	In spectroscopic methods, the probe is a beam of light with pre-defined energy (for example in the case of laser beam for Raman measurements) or pre-defined polarization (for example in the case of light beam for Spectroscopic Ellipsometry methods), that will be properly focused on the sample’s surface with a welldefined geometry (specific angle of incidence).
Example	In x-ray diffraction, the probe is a beam of x-rays with known energy that is properly focused on the sample’s surface with a well-defined geometry
Label	Probe
Formal description
Subclass Of	CharacterisationHardware

ProbeSampleInteraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ProbeSampleInteraction
Annotations
Preflabel	ProbeSampleInteraction
Elucidation	Process representing the interaction between the Probe and the Sample (with a certain Interaction Volume) which generates a Signal
Comment	Process representing the interaction between the Probe and the Sample (with a certain Interaction Volume) which generates a Signal
Comment
Label	ProbeSampleInteraction
Formal description
Subclass Of	Whole
Subclass Of	Process
Subclass Of	hasTemporaryParticipant some Probe
Subclass Of	hasTemporaryParticipant some Sample
Subclass Of	hasOutput some Signal

ProcessingReproducibility

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ProcessingReproducibility
Annotations
Preflabel	ProcessingReproducibility
Elucidation	Description of performed statistical analysis to check for data reproducibility (e.g. easily reproducible for everyone, reproducible for a domain expert, reproducible only for Data processing Expert)
Comment	Description of performed statistical analysis to check for data reproducibility (e.g. easily reproducible for everyone, reproducible for a domain expert, reproducible only for Data processing Expert)
Comment
Label	ProcessingReproducibility
Formal description
Subclass Of	Thing

Profilometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Profilometry
Annotations
Preflabel	Profilometry
Elucidation	Profilometry is a technique used to extract topographical data from a surface. This can be a single point, a line scan or even a full three dimensional scan. The purpose of profilometry is to get surface morphology, step heights and surface roughness.
Comment	Profilometry is a technique used to extract topographical data from a surface. This can be a single point, a line scan or even a full three dimensional scan. The purpose of profilometry is to get surface morphology, step heights and surface roughness.
Comment
Label	Profilometry
Formal description
Subclass Of	CharacterisationTechnique

PseudoOpenCircuitVoltageMethod

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PseudoOpenCircuitVoltageMethod
Annotations
Preflabel	PseudoOpenCircuitVoltageMethod
Elucidation	a technique used to measure the voltage of a cell under a low applied current as an estimate for the open-circuit voltage
Comment	a technique used to measure the voltage of a cell under a low applied current as an estimate for the open-circuit voltage
Comment
Altlabel	PseudoOCV
Label	PseudoOpenCircuitVoltageMethod
Formal description
Subclass Of	Chronopotentiometry

PulsedElectroacousticMethod

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#PulsedElectroacousticMethod
Annotations
Preflabel	PulsedElectroacousticMethod
Elucidation	The pulsed electroacoustic (PEA) method is an established method for space charge measurements in polymeric dielectrics.
Comment	The pulsed electroacoustic (PEA) method is an established method for space charge measurements in polymeric dielectrics.
Comment
Iupacreference	https://doi.org/10.1007/s10832-023-00332-y
Label	PulsedElectroacousticMethod
Formal description
Subclass Of	ChargeDistribution

RamanSpectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#RamanSpectroscopy
Annotations
Preflabel	RamanSpectroscopy
Elucidation	Raman spectroscopy (/ˈrɑːmən/) (named after physicist C. V. Raman) is a spectroscopic technique typically used to determine vibrational modes of molecules, although rotational and other low-frequency modes of systems may also be observed. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified. Raman spectroscopy relies upon inelastic scattering of photons, known as Raman scattering. A source of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range is used, although X-rays can also be used. The laser light interacts with molecular vibrations, phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the vibrational modes in the system. Infrared spectroscopy typically yields similar yet complementary information. Typically, a sample is illuminated with a laser beam. Electromagnetic radiation from the illuminated spot is collected with a lens and sent through a monochromator. Elastic scattered radiation at the wavelength corresponding to the laser line (Rayleigh scattering) is filtered out by either a notch filter, edge pass filter, or a band pass filter, while the rest of the collected light is dispersed onto a detector.
Comment	Raman spectroscopy (/ˈrɑːmən/) (named after physicist C. V. Raman) is a spectroscopic technique typically used to determine vibrational modes of molecules, although rotational and other low-frequency modes of systems may also be observed. Raman spectroscopy is commonly used in chemistry to provide a structural fingerprint by which molecules can be identified. Raman spectroscopy relies upon inelastic scattering of photons, known as Raman scattering. A source of monochromatic light, usually from a laser in the visible, near infrared, or near ultraviolet range is used, although X-rays can also be used. The laser light interacts with molecular vibrations, phonons or other excitations in the system, resulting in the energy of the laser photons being shifted up or down. The shift in energy gives information about the vibrational modes in the system. Infrared spectroscopy typically yields similar yet complementary information. Typically, a sample is illuminated with a laser beam. Electromagnetic radiation from the illuminated spot is collected with a lens and sent through a monochromator. Elastic scattered radiation at the wavelength corresponding to the laser line (Rayleigh scattering) is filtered out by either a notch filter, edge pass filter, or a band pass filter, while the rest of the collected light is dispersed onto a detector.
Comment
Label	RamanSpectroscopy
Formal description
Subclass Of	Spectroscopy

Rationale

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Rationale
Annotations
Preflabel	Rationale
Elucidation	A set of reasons or a logical basis for a decision or belief
Comment	A set of reasons or a logical basis for a decision or belief
Label	Rationale
Formal description
Subclass Of	String

RawData

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#RawData
Annotations
Preflabel	RawData
Elucidation	Direct output of the equipment with the manufacturer’s software including automatic pre-processing that is not modified by the user once the acquisition method is defined and the equipment calibrated.
Elucidation	The raw data is a set of (unprocessed) data that is given directly as output from the detector, usually expressed as a function of time or position, or photon energy.
Comment	In some cases, raw data can be considered to have already some level of data processing, e.g., in electron microscopy a “raw image” that is formed on the screen is already result from multiple processing after the signal is acquired by the detector.
Comment	Direct output of the equipment with the manufacturer’s software including automatic pre-processing that is not modified by the user once the acquisition method is defined and the equipment calibrated.
Comment	In some cases, raw data can be considered to have already some level of data processing, e.g., in electron microscopy a “raw image” that is formed on the screen is already result from multiple processing after the signal is acquired by the detector.
Comment
Example	In mechanical testing, examples of raw data are raw-force, raw-displacement, coordinates as function of time.
Example	In spectroscopic testing, the raw data are light intensity, or refractive index, or optical absorption as a function of the energy (or wavelength) of the incident light beam.
Label	RawData
Formal description
Subclass Of	MeasurementResult
Subclass Of	CharacterisationData

RawSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#RawSample
Annotations
Preflabel	RawSample
Comment
Label	RawSample
Formal description
Subclass Of	Sample

ReferenceSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ReferenceSample
Annotations
Preflabel	ReferenceSample
Elucidation	Material, sufficiently homogeneous and stable with respect to one or more specified properties, which has been established to be fit for its intended use in a measurement process”.
Comment	Material, sufficiently homogeneous and stable with reference to one or more specified properties, which has been established to be fit for its intended use in measurement or in examination NOTE 1 Reference materials can be certified reference materials or reference materials without a certified property value. NOTE 2 For a reference material to be used as a measurement standard for calibration purposes it needs to be a certified reference material. NOTE 3 Reference materials can be used for measurement precision evaluation and quality control. EXAMPLE Human serum without an assigned quantity value for the amount-of-substance concentration of the inherent cholesterol, used for quality control. NOTE 4 Properties of reference materials can be quantities or nominal properties. NOTE 5 A reference material is sometimes incorporated into a specially fabricated device. EXAMPLE Spheres of uniform size mounted on a microscope slide. NOTE 6 Some reference materials have assigned values in a unit outside the SI. Such materials include vaccines to which International Units (IU) have been assigned by the World Health Organization. NOTE 7 A given reference material can only be used for one purpose in a measurement, either calibration or quality control, but not both. NOTE 8 ISO/REMCO has an analogous definition but uses the term “measurement process” (ISO Guide 30, Reference materials – Selected terms and definitions, definition 2.1.1) for both measurement and examination. -- International Vocabulary of Metrology(VIM)
Comment	Material, sufficiently homogeneous and stable with respect to one or more specified properties, which has been established to be fit for its intended use in a measurement process”.
Comment
Altlabel	Certified Reference Material
Altlabel	Reference material
Altlabel	ReferenceSpecimen
Vimterm	Reference material
Definition	Material, sufficiently homogeneous and stable with reference to one or more specified properties, which has been established to be fit for its intended use in measurement or in examination NOTE 1 Reference materials can be certified reference materials or reference materials without a certified property value. NOTE 2 For a reference material to be used as a measurement standard for calibration purposes it needs to be a certified reference material. NOTE 3 Reference materials can be used for measurement precision evaluation and quality control. EXAMPLE Human serum without an assigned quantity value for the amount-of-substance concentration of the inherent cholesterol, used for quality control. NOTE 4 Properties of reference materials can be quantities or nominal properties. NOTE 5 A reference material is sometimes incorporated into a specially fabricated device. EXAMPLE Spheres of uniform size mounted on a microscope slide. NOTE 6 Some reference materials have assigned values in a unit outside the SI. Such materials include vaccines to which International Units (IU) have been assigned by the World Health Organization. NOTE 7 A given reference material can only be used for one purpose in a measurement, either calibration or quality control, but not both. NOTE 8 ISO/REMCO has an analogous definition but uses the term “measurement process” (ISO Guide 30, Reference materials – Selected terms and definitions, definition 2.1.1) for both measurement and examination. -- International Vocabulary of Metrology(VIM)
Definition	Quality control sample used to determine accuracy and precision of method. [ISO 17858:2007]
Label	ReferenceSample
Formal description
Subclass Of	Sample

Sample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Sample
Annotations
Preflabel	Sample
Elucidation	Portion of material selected from a larger quantity of material. The term needs to be qualified, e.g., bulk sample, representative sample, primary sample, bulked sample, test sample, etc. The term 'sample' implies the existence of a sampling error, i.e., the results obtained on the portions taken are only estimates of the concentration of a constituent or the quantity of a property present in the parent material.
Comment	Sample and Specime are often used interchangeably. However in some cases the term Specimen is used to specify a portion taken under conditions such that the sampling variability cannot be assessed (usually because the population is changing), and is assumed, for convenience, to be zero.
Comment	Portion of material selected from a larger quantity of material. The term needs to be qualified, e.g., bulk sample, representative sample, primary sample, bulked sample, test sample, etc. The term 'sample' implies the existence of a sampling error, i.e., the results obtained on the portions taken are only estimates of the concentration of a constituent or the quantity of a property present in the parent material.
Comment
Comment	Sample and Specime are often used interchangeably. However in some cases the term Specimen is used to specify a portion taken under conditions such that the sampling variability cannot be assessed (usually because the population is changing), and is assumed, for convenience, to be zero.
Altlabel	Specimen
Label	Sample
Formal description
Subclass Of	Object

SampleExtraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleExtraction
Annotations
Preflabel	SampleExtraction
Elucidation	Act of extracting a portion (amount) of material from a larger quantity of material. This operation results in obtaining a sample representative of the batch with respect to the property or properties being investigated.
Comment	The term can be used to cover either a unit of supply or a portion for analysis. The portion taken may consist of one or more sub-samples and the batch may be the population from which the sample is taken.
Comment	Act of extracting a portion (amount) of material from a larger quantity of material. This operation results in obtaining a sample representative of the batch with respect to the property or properties being investigated.
Comment	The term can be used to cover either a unit of supply or a portion for analysis. The portion taken may consist of one or more sub-samples and the batch may be the population from which the sample is taken.
Comment
Label	SampleExtraction
Formal description
Subclass Of	CharacterisationProcedure
Subclass Of	hasInput some Material
Subclass Of	hasOutput some Sample

SampleExtractionByCutting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleExtractionByCutting
Annotations
Formal description
Subclass Of	Cutting
Subclass Of	SampleExtraction

SampleExtractionInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleExtractionInstrument
Annotations
Preflabel	SampleExtractionInstrument
Comment
Label	SampleExtractionInstrument
Formal description
Subclass Of	CharacterisationHardware

SampleInspection

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspection
Annotations
Preflabel	SampleInspection
Elucidation	Analysis of the sample in order to determine information that are relevant for the characterisation method.
Comment	Analysis of the sample in order to determine information that are relevant for the characterisation method.
Comment
Example	In the Nanoindentation method the Scanning Electron Microscope to determine the indentation area.
Label	SampleInspection
Formal description
Subclass Of	CharacterisationProcedure
Subclass Of	hasTemporaryParticipant some Sample
Subclass Of	hasTemporaryParticipant some SampleInspectionInstrument
Subclass Of	hasInput some SampleInspectionParameter
Subclass Of	hasOutput some CharacterisationData

SampleInspectionInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspectionInstrument
Annotations
Preflabel	SampleInspectionInstrument
Comment
Label	SampleInspectionInstrument
Formal description
Subclass Of	CharacterisationHardware

SampleInspectionParameter

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampleInspectionParameter
Annotations
Preflabel	SampleInspectionParameter
Elucidation	Parameter used for the sample inspection process
Comment	Parameter used for the sample inspection process
Comment
Label	SampleInspectionParameter
Formal description
Subclass Of	Parameter

SamplePreparation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparation
Annotations
Preflabel	SamplePreparation
Elucidation	Sample preparation processes (e.g., machining, polishing, cutting to size, etc.) before actual observation and measurement.
Comment	Sample preparation processes (e.g., machining, polishing, cutting to size, etc.) before actual observation and measurement.
Comment
Label	SamplePreparation
Formal description
Subclass Of	CharacterisationProcedure
Subclass Of	hasTemporaryParticipant some SamplePreparationInstrument
Subclass Of	hasInput some Sample
Subclass Of	hasInput some SamplePreparationParameter
Subclass Of	hasOutput some Sample

SamplePreparationByCutting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationByCutting
Annotations
Formal description
Subclass Of	Cutting
Subclass Of	SamplePreparation

SamplePreparationInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationInstrument
Annotations
Preflabel	SamplePreparationInstrument
Comment
Label	SamplePreparationInstrument
Formal description
Subclass Of	CharacterisationHardware

SamplePreparationParameter

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SamplePreparationParameter
Annotations
Preflabel	SamplePreparationParameter
Elucidation	Parameter used for the sample preparation process
Comment	Parameter used for the sample preparation process
Comment
Label	SamplePreparationParameter
Formal description
Subclass Of	Parameter

SampledDCPolarography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SampledDCPolarography
Annotations
Preflabel	SampledDCPolarography
Elucidation	DC polarography with current sampling at the end of each drop life mechanically enforced by a knocker at a preset drop time value. The current sampling and mechanical drop dislodge are synchronized.
Comment	DC polarography with current sampling at the end of each drop life mechanically enforced by a knocker at a preset drop time value. The current sampling and mechanical drop dislodge are synchronized.
Comment	In this way, the ratio of faradaic current to double layer charging current is enhanced and the negative influence of charging current is partially eliminated. Due to the improved signal (faradaic current) to noise (charging current) ratio, the limit of detection is lowered.
Comment
Altlabel	TASTPolarography
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	SampledDCPolarography
Formal description
Subclass Of	DCPolarography

ScanningAugerElectronMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningAugerElectronMicroscopy
Annotations
Preflabel	ScanningAugerElectronMicroscopy
Elucidation	Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample.
Comment	Auger electron spectroscopy (AES or simply Auger) is a surface analysis technique that uses an electron beam to excite electrons on atoms in the particle. Atoms that are excited by the electron beam can emit “Auger” electrons. AES measures the kinetic energies of the emitted electrons. The energy of the emitted electrons is characteristic of elements present at the surface and near the surface of a sample.
Comment
Altlabel	AES
Label	ScanningAugerElectronMicroscopy
Formal description
Subclass Of	Microscopy

ScanningElectronMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningElectronMicroscopy
Annotations
Preflabel	ScanningElectronMicroscopy
Elucidation	The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample.
Comment	The scanning electron microscope (SEM) uses a focused beam of high-energy electrons to generate a variety of signals at the surface of solid specimens. The signals that derive from electron-sample interactions reveal information about the sample including external morphology (texture), chemical composition, and crystalline structure and orientation of materials making up the sample.
Comment
Altlabel	SEM
Label	ScanningElectronMicroscopy
Formal description
Subclass Of	Microscopy

ScanningKelvinProbe

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningKelvinProbe
Annotations
Preflabel	ScanningKelvinProbe
Elucidation	Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact.
Comment	Scanning Kelvin probe (SKP) and scanning Kelvin probe force microscopy (SKPFM) are probe techniques which permit mapping of topography and Volta potential distribution on electrode surfaces. It measures the surface electrical potential of a sample without requiring an actual physical contact.
Comment
Altlabel	SKB
Label	ScanningKelvinProbe
Formal description
Subclass Of	Microscopy

ScanningProbeMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningProbeMicroscopy
Annotations
Preflabel	ScanningProbeMicroscopy
Elucidation	Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.
Comment	Scanning probe microscopy (SPM) is a branch of microscopy that forms images of surfaces using a physical probe that scans the specimen.
Comment
Label	ScanningProbeMicroscopy
Formal description
Subclass Of	Microscopy

ScanningTunnelingMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScanningTunnelingMicroscopy
Annotations
Preflabel	ScanningTunnelingMicroscopy
Elucidation	Scanning Tunneling Microscopy, or STM, is an imaging technique used to obtain ultra-high resolution images at the atomic scale, without using light or electron beams.
Comment	Scanning Tunneling Microscopy, or STM, is an imaging technique used to obtain ultra-high resolution images at the atomic scale, without using light or electron beams.
Comment
Altlabel	STM
Label	ScanningTunnelingMicroscopy
Formal description
Subclass Of	Microscopy

ScatteringAndDiffraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ScatteringAndDiffraction
Annotations
Preflabel	ScatteringAndDiffraction
Comment
Label	ScatteringAndDiffraction
Formal description
Subclass Of	CharacterisationTechnique

SecondaryData

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryData
Annotations
Preflabel	SecondaryData
Elucidation	Data resulting from the application of post-processing or model generation to other data.
Comment	Data resulting from the application of post-processing or model generation to other data.
Comment
Altlabel	Elaborated data
Example	Deconvoluted curves
Example	Intensity maps
Label	SecondaryData
Formal description
Subclass Of	CharacterisationData

SecondaryIonMassSpectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SecondaryIonMassSpectrometry
Annotations
Preflabel	SecondaryIonMassSpectrometry
Elucidation	Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.
Comment	Secondary-ion mass spectrometry (SIMS) is a technique used to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.
Comment
Altlabel	SIMS
Label	SecondaryIonMassSpectrometry
Formal description
Subclass Of	Spectrometry

ShearOrTorsionTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ShearOrTorsionTesting
Annotations
Preflabel	ShearOrTorsionTesting
Comment
Label	ShearOrTorsionTesting
Formal description
Subclass Of	MechanicalTesting

Signal

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Signal
Annotations
Preflabel	Signal
Elucidation	Result (effect) of the interaction between the sample and the probe, which usually is a measurable and quantifiable quantity.
Comment	Signal is usually emitted from a characteristic “emission” volume, which can be different from the sample/probe “interaction” volume and can be usually quantified using proper physics equations and/or modelling of the interaction mechanisms.
Comment	According to UPAC Compendium of Chemical Terminology, a “signal” is “A representation of a quantity within an analytical instrument” (https://goldbook.iupac.org/terms/view/S05661 ).
Comment	Result (effect) of the interaction between the sample and the probe, which usually is a measurable and quantifiable quantity.
Comment	Signal is usually emitted from a characteristic “emission” volume, which can be different from the sample/probe “interaction” volume and can be usually quantified using proper physics equations and/or modelling of the interaction mechanisms.
Comment
Definition	According to UPAC Compendium of Chemical Terminology, a “signal” is “A representation of a quantity within an analytical instrument” (https://goldbook.iupac.org/terms/view/S05661 ).
Label	Signal
Formal description
Subclass Of	CharacterisationData

Spectrometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Spectrometry
Annotations
Preflabel	Spectrometry
Elucidation	Spectroscopic techniques are numerous and varied, but all involve measuring the response of a material to different frequencies of electromagnetic radiation. Depending on the technique used, material characterization may be based on the absorption, emission, impedance, or reflection of incident energy by a sample.
Comment	Spectroscopic techniques are numerous and varied, but all involve measuring the response of a material to different frequencies of electromagnetic radiation. Depending on the technique used, material characterization may be based on the absorption, emission, impedance, or reflection of incident energy by a sample.
Comment
Label	Spectrometry
Formal description
Subclass Of	CharacterisationTechnique

Spectroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Spectroscopy
Annotations
Preflabel	Spectroscopy
Elucidation	Spectroscopy is a category of characterization techniques which use a range of principles to reveal the chemical composition, composition variation, crystal structure and photoelectric properties of materials.
Comment	Spectroscopy is a category of characterization techniques which use a range of principles to reveal the chemical composition, composition variation, crystal structure and photoelectric properties of materials.
Comment
Label	Spectroscopy
Formal description
Subclass Of	CharacterisationTechnique

SquareWaveVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#SquareWaveVoltammetry
Annotations
Preflabel	SquareWaveVoltammetry
Elucidation	voltammetry in which a square-wave potential waveform is superimposed on an underlying linearly varying potential ramp or staircase ramp
Comment	Most instruments show plots of the current at the end of the forward-going pulse and of the backward-going pulse vs. the potential, as well as their difference. This can give valuable information on the kinetics of the electrode reaction and the electrode process.
Comment	The current is sampled just before the end of the forward- going pulse and of the backward-going pulse and the difference of the two sampled currents is plotted versus the applied potential of the potential or staircase ramp. The square-wave voltammogram is peak-shaped
Comment	The sensitivity of SWV depends on the reversibility of the electrode reaction of the analyte.
Comment	voltammetry in which a square-wave potential waveform is superimposed on an underlying linearly varying potential ramp or staircase ramp
Comment
Altlabel	OSWV
Altlabel	OsteryoungSquareWaveVoltammetry
Altlabel	SWV
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q4016323
Wikipediareference	https://en.wikipedia.org/wiki/Squarewave_voltammetry
Label	SquareWaveVoltammetry
Formal description
Subclass Of	Voltammetry

StepChronopotentiometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#StepChronopotentiometry
Annotations
Preflabel	StepChronopotentiometry
Elucidation	chronopotentiometry where the applied current is changed in steps
Comment	chronopotentiometry where the applied current is changed in steps
Comment
Label	StepChronopotentiometry
Formal description
Subclass Of	Chronopotentiometry

StrippingVoltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#StrippingVoltammetry
Annotations
Preflabel	StrippingVoltammetry
Elucidation	two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the amount of an accumulated species is measured by voltammetry. The measured electric current in step 2 is related to the concentration of analyte in the solution by calibration.
Comment	Anodic stripping voltammetry (ASV) was historically used to measure concentrations of metal ions in solution using cathodic accumulation with mercury to form an amalgam. Due to the toxicity of mercury and its compounds, inductively coupled plasma optical emission spectrometry and inductively coupled plasma mass spectrometry have frequently replaced ASV at mercury electrodes in the laboratory, often sacrificing the probing of speciation and lability in complex matrices. Mercury has now been replaced by non-toxic bismuth or anti- mony as films on a solid electrode support (such as glassy carbon) with equally good sensi- tivity and detection limits.
Comment	Because the accumulation (pre-concentration) step can be prolonged, increasing the amount of material at the electrode, stripping voltammetry is able to measure very small concentrations of analyte.
Comment	Often the product of the electrochemical stripping is identical to the analyte before the accumulation.
Comment	Stripping voltammetry is a calibrated method to establish the relation between amount accumulated in a given time and the concentration of the analyte in solution.
Comment	Types of stripping voltammetry refer to the kind of accumulation (e.g. adsorptive stripping voltammetry) or the polarity of the stripping electrochemistry (anodic, cathodic stripping voltammetry).
Comment	two-step electrochemical measurement in which 1) material is accumulated at an electrode and 2) the amount of an accumulated species is measured by voltammetry. The measured electric current in step 2 is related to the concentration of analyte in the solution by calibration.
Comment
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikipediareference	https://en.wikipedia.org/wiki/Electrochemical_stripping_analysis
Label	StrippingVoltammetry
Formal description
Subclass Of	Voltammetry

Synchrotron

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Synchrotron
Annotations
Preflabel	Synchrotron
Comment
Label	Synchrotron
Formal description
Subclass Of	ScatteringAndDiffraction

TensileTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#TensileTesting
Annotations
Preflabel	TensileTesting
Elucidation	Tensile testing, also known as tension testing, is a test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength, breaking strength, maximum elongation and reduction in area. From these measurements the following properties can also be determined: Young's modulus, Poisson's ratio, yield strength, and strain-hardening characteristics. Uniaxial tensile testing is the most commonly used for obtaining the mechanical characteristics of isotropic materials. Some materials use biaxial tensile testing. The main difference between these testing machines being how load is applied on the materials.
Comment	Tensile testing, also known as tension testing, is a test in which a sample is subjected to a controlled tension until failure. Properties that are directly measured via a tensile test are ultimate tensile strength, breaking strength, maximum elongation and reduction in area. From these measurements the following properties can also be determined: Young's modulus, Poisson's ratio, yield strength, and strain-hardening characteristics. Uniaxial tensile testing is the most commonly used for obtaining the mechanical characteristics of isotropic materials. Some materials use biaxial tensile testing. The main difference between these testing machines being how load is applied on the materials.
Comment
Altlabel	TensionTest
Label	TensileTesting
Formal description
Subclass Of	MechanicalTesting

ThermochemicalTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ThermochemicalTesting
Annotations
Preflabel	ThermochemicalTesting
Elucidation	Thermomechanical analysis (TMA) is a technique used in thermal analysis, a branch of materials science which studies the properties of materials as they change with temperature.
Comment	Thermomechanical analysis (TMA) is a technique used in thermal analysis, a branch of materials science which studies the properties of materials as they change with temperature.
Comment
Altlabel	TMA
Label	ThermochemicalTesting
Formal description
Subclass Of	CharacterisationTechnique

Thermogravimetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Thermogravimetry
Annotations
Preflabel	Thermogravimetry
Elucidation	Thermogravimetric analysis or thermal gravimetric analysis (TGA) is a method of thermal analysis in which the mass of a sample is measured over time as the temperature changes. This measurement provides information about physical phenomena, such as phase transitions, absorption, adsorption and desorption; as well as chemical phenomena including chemisorptions, thermal decomposition, and solid-gas reactions (e.g., oxidation or reduction).
Comment	Thermogravimetric analysis or thermal gravimetric analysis (TGA) is a method of thermal analysis in which the mass of a sample is measured over time as the temperature changes. This measurement provides information about physical phenomena, such as phase transitions, absorption, adsorption and desorption; as well as chemical phenomena including chemisorptions, thermal decomposition, and solid-gas reactions (e.g., oxidation or reduction).
Comment
Altlabel	TGA
Label	Thermogravimetry
Formal description
Subclass Of	ThermochemicalTesting

ThreePointBendingTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#ThreePointBendingTesting
Annotations
Preflabel	ThreePointBendingTesting
Elucidation	Method of mechanical testing that provides values for the modulus of elasticity in bending, flexural stress, flexural strain, and the flexural stress–strain response of a material sample
Comment	Method of mechanical testing that provides values for the modulus of elasticity in bending, flexural stress, flexural strain, and the flexural stress–strain response of a material sample
Comment
Altlabel	ThreePointFlexuralTest
Wikidatareference	https://www.wikidata.org/wiki/Q2300905
Wikipediareference	https://en.wikipedia.org/wiki/Three-point_flexural_test
Label	ThreePointBendingTesting
Formal description
Subclass Of	MechanicalTesting

Tomography

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Tomography
Annotations
Preflabel	Tomography
Elucidation	Tomography is imaging by sections or sectioning that uses any kind of penetrating wave. The method is used in radiology, archaeology, biology, atmospheric science, geophysics, oceanography, plasma physics, materials science, cosmochemistry, astrophysics, quantum information, and other areas of science. The word tomography is derived from Ancient Greek τόμος tomos, "slice, section" and γράφω graphō, "to write" or, in this context as well, "to describe." A device used in tomography is called a tomograph, while the image produced is a tomogram.
Comment	Tomography is imaging by sections or sectioning that uses any kind of penetrating wave. The method is used in radiology, archaeology, biology, atmospheric science, geophysics, oceanography, plasma physics, materials science, cosmochemistry, astrophysics, quantum information, and other areas of science. The word tomography is derived from Ancient Greek τόμος tomos, "slice, section" and γράφω graphō, "to write" or, in this context as well, "to describe." A device used in tomography is called a tomograph, while the image produced is a tomogram.
Label	Tomography
Formal description
Subclass Of	CharacterisationTechnique

TransmissionElectronMicroscopy

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#TransmissionElectronMicroscopy
Annotations
Preflabel	TransmissionElectronMicroscopy
Elucidation	Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Comment	Transmission electron microscopy (TEM) is a microscopy technique in which a beam of electrons is transmitted through a specimen to form an image. The specimen is most often an ultrathin section less than 100 nm thick or a suspension on a grid. An image is formed from the interaction of the electrons with the sample as the beam is transmitted through the specimen. The image is then magnified and focused onto an imaging device, such as a fluorescent screen, a layer of photographic film, or a sensor such as a scintillator attached to a charge-coupled device.
Comment
Altlabel	TEM
Label	TransmissionElectronMicroscopy
Formal description
Subclass Of	Microscopy

UltrasonicTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#UltrasonicTesting
Annotations
Preflabel	UltrasonicTesting
Elucidation	Ultrasonic testing (UT) is a family of non-destructive testing techniques based on the propagation of ultrasonic waves in the object or material tested. In most common UT applications, very short ultrasonic pulse-waves with center frequencies ranging from 0.1-15 MHz, and occasionally up to 50 MHz, are transmitted into materials to detect internal flaws or to characterize materials. A common example is ultrasonic thickness measurement, which tests the thickness of the test object, for example, to monitor pipework corrosion. Ultrasonic testing is often performed on steel and other metals and alloys, though it can also be used on concrete, wood and composites, albeit with less resolution. It is used in many industries including steel and aluminium construction, metallurgy, manufacturing, aerospace, automotive and other transportation sectors.
Comment	Ultrasonic testing (UT) is a family of non-destructive testing techniques based on the propagation of ultrasonic waves in the object or material tested. In most common UT applications, very short ultrasonic pulse-waves with center frequencies ranging from 0.1-15 MHz, and occasionally up to 50 MHz, are transmitted into materials to detect internal flaws or to characterize materials. A common example is ultrasonic thickness measurement, which tests the thickness of the test object, for example, to monitor pipework corrosion. Ultrasonic testing is often performed on steel and other metals and alloys, though it can also be used on concrete, wood and composites, albeit with less resolution. It is used in many industries including steel and aluminium construction, metallurgy, manufacturing, aerospace, automotive and other transportation sectors.
Label	UltrasonicTesting
Formal description
Subclass Of	CharacterisationTechnique

UserCase

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#UserCase
Annotations
Preflabel	UserCase
Elucidation	High level description of the user case. It can include the properties of the material, the conditions of the environment and possibly mentioning which are the industrial sectors of reference.
Comment	High level description of the user case. It can include the properties of the material, the conditions of the environment and possibly mentioning which are the industrial sectors of reference.
Label	UserCase
Formal description
Subclass Of	String

VaporPressureDepressionOsmometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#VaporPressureDepressionOsmometry
Annotations
Preflabel	VaporPressureDepressionOsmometry
Elucidation	Vapor pressure osmometry measures vapor pressure indirectly by measuring the change in temperature of a polymer solution on dilution by solvent vapor and is generally useful for polymers with Mn below 10,000–40,000 g/mol. When molecular weight is more than that limit, the quantity being measured becomes very small to detect.
Comment	Vapor pressure osmometry measures vapor pressure indirectly by measuring the change in temperature of a polymer solution on dilution by solvent vapor and is generally useful for polymers with Mn below 10,000–40,000 g/mol. When molecular weight is more than that limit, the quantity being measured becomes very small to detect.
Comment
Altlabel	VPO
Label	VaporPressureDepressionOsmometry
Formal description
Subclass Of	Osmometry

Viscometry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Viscometry
Annotations
Preflabel	Viscometry
Elucidation	Viscometry or viscosity method was one of the first methods used for determining the MW of polymers. In this method, the viscosity of polymer solution is measured, and the simplest method used is capillary viscometry by using the Ubbelohde U-tube viscometer. In this method, both the flow time of the polymer solution (t) and the flow time of the pure solvent (t0) are recorded. The ratio of the polymer solution flow time (t) to the flow time of pure solvent (t0) is equal to the ratio of their viscosities (η/η0) only if they have the same densities.
Comment	Viscometry or viscosity method was one of the first methods used for determining the MW of polymers. In this method, the viscosity of polymer solution is measured, and the simplest method used is capillary viscometry by using the Ubbelohde U-tube viscometer. In this method, both the flow time of the polymer solution (t) and the flow time of the pure solvent (t0) are recorded. The ratio of the polymer solution flow time (t) to the flow time of pure solvent (t0) is equal to the ratio of their viscosities (η/η0) only if they have the same densities.
Comment
Altlabel	Viscosity
Label	Viscometry
Formal description
Subclass Of	CharacterisationTechnique

Voltammetry

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#Voltammetry
Annotations
Preflabel	Voltammetry
Elucidation	Voltammetry is an analytical technique based on the measure of the current flowing through an electrode dipped in a solution containing electro-active compounds, while a potential scanning is imposed upon it.
Comment	The current vs. potential (I-E) curve is called a voltammogram.
Comment	Voltammetry is an analytical technique based on the measure of the current flowing through an electrode dipped in a solution containing electro-active compounds, while a potential scanning is imposed upon it.
Comment
Ievreference	https://www.electropedia.org/iev/iev.nsf/display?openform&ievref=114-04-11
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Wikidatareference	https://www.wikidata.org/wiki/Q904093
Wikipediareference	https://en.wikipedia.org/wiki/Voltammetry
Label	Voltammetry
Formal description
Subclass Of	ElectrochemicalTesting

VoltammetryAtARotatingDiskElectrode

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#VoltammetryAtARotatingDiskElectrode
Annotations
Preflabel	VoltammetryAtARotatingDiskElectrode
Elucidation	Hydrodynamic voltammetry using a a rotating disc electrode, where the limiting current is described by the Levich equation
Comment	Hydrodynamic voltammetry using a a rotating disc electrode, where the limiting current is described by the Levich equation
Iupacreference	https://doi.org/10.1515/pac-2018-0109
Label	VoltammetryAtARotatingDiskElectrode
Formal description
Subclass Of	HydrodynamicVoltammetry

WearTesting

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#WearTesting
Annotations
Preflabel	WearTesting
Elucidation	A wear test measures the changes in conditions caused by friction, and the result is obtained from deformation, scratches, and indentations on the interacting surfaces. Wear is defined as the progressive removal of the material from a solid surface and manifested by a change in the geometry of the surface.
Comment	A wear test measures the changes in conditions caused by friction, and the result is obtained from deformation, scratches, and indentations on the interacting surfaces. Wear is defined as the progressive removal of the material from a solid surface and manifested by a change in the geometry of the surface.
Label	WearTesting
Formal description
Subclass Of	MechanicalTesting

XpsVariableKinetic

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#XpsVariableKinetic
Annotations
Preflabel	XpsVariableKinetic
Elucidation	X-ray photoelectron spectroscopy (XPS), also known as ESCA (electron spectroscopy for chemical analysis) is a surface analysis technique which provides both elemental and chemical state information virtually without restriction on the type of material which can be analysed. It is a relatively simple technique where the sample is illuminated with X-rays which have enough energy to eject an electron from the atom. These ejected electrons are known as photoelectrons. The kinetic energy of these emitted electrons is characteristic of the element from which the photoelectron originated. The position and intensity of the peaks in an energy spectrum provide the desired chemical state and quantitative information. The surface sensitivity of XPS is determined by the distance that that photoelectron can travel through the material without losing any kinteic energy. These elastiaclly scattered photoelectrons contribute to the photoelectron peak, whilst photoelectrons that have been inelastically scattered, losing some kinetic energy before leaving the material, will contribute to the spectral background.
Comment	X-ray photoelectron spectroscopy (XPS), also known as ESCA (electron spectroscopy for chemical analysis) is a surface analysis technique which provides both elemental and chemical state information virtually without restriction on the type of material which can be analysed. It is a relatively simple technique where the sample is illuminated with X-rays which have enough energy to eject an electron from the atom. These ejected electrons are known as photoelectrons. The kinetic energy of these emitted electrons is characteristic of the element from which the photoelectron originated. The position and intensity of the peaks in an energy spectrum provide the desired chemical state and quantitative information. The surface sensitivity of XPS is determined by the distance that that photoelectron can travel through the material without losing any kinteic energy. These elastiaclly scattered photoelectrons contribute to the photoelectron peak, whilst photoelectrons that have been inelastically scattered, losing some kinetic energy before leaving the material, will contribute to the spectral background.
Altlabel	Electron spectroscopy for chemical analysis (ESCA)
Altlabel	X-ray photoelectron spectroscopy (XPS)
Label	XpsVariableKinetic
Formal description
Subclass Of	Spectroscopy

XrayDiffraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#XrayDiffraction
Annotations
Preflabel	XrayDiffraction
Elucidation	a technique used to analyze the atomic and molecular structure of crystalline materials by observing the diffraction patterns produced when X-rays interact with the regular array of atoms in the crystal lattice
Comment	a technique used to analyze the atomic and molecular structure of crystalline materials by observing the diffraction patterns produced when X-rays interact with the regular array of atoms in the crystal lattice
Comment
Altlabel	XRD
Wikidatareference	https://www.wikidata.org/wiki/Q12101244
Wikipediareference	https://en.wikipedia.org/wiki/X-ray_crystallography
Label	XrayDiffraction
Formal description
Subclass Of	ScatteringAndDiffraction

XrayPowderDiffraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#XrayPowderDiffraction
Annotations
Preflabel	XrayPowderDiffraction
Elucidation	a method for analyzing the crystal structure of powdered materials by measuring the diffraction patterns produced when X-rays interact with randomly oriented crystallites within the sample
Comment	a method for analyzing the crystal structure of powdered materials by measuring the diffraction patterns produced when X-rays interact with randomly oriented crystallites within the sample
Comment
Altlabel	XRPD
Wikipediareference	https://en.wikipedia.org/wiki/Powder_diffraction
Label	XrayPowderDiffraction
Formal description
Subclass Of	XrayDiffraction

XrdGrazingIncidence

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#XrdGrazingIncidence
Annotations
Preflabel	XrdGrazingIncidence
Comment
Label	XrdGrazingIncidence
Formal description
Subclass Of	ScatteringAndDiffraction

Object Properties

hasAccessConditions

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasAccessConditions
Annotations
Preflabel	hasAccessConditions
Comment
Label	hasAccessConditions
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasBPMNDiagram

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasBPMNDiagram
Annotations
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasIcon

hasBeginCharacterisationTask

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasBeginCharacterisationTask
Annotations
Preflabel	hasBeginCharacterisationTask
Comment
Altlabel	hasBeginCharacterizationTask
Label	hasBeginCharacterisationTask
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasBeginTask

hasCharacterisationComponent

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationComponent
Annotations
Preflabel	hasCharacterisationComponent
Comment
Altlabel	hasCharacterizationComponent
Label	hasCharacterisationComponent
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasComponent

hasCharacterisationEnvironment

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationEnvironment
Annotations
Preflabel	hasCharacterisationEnvironment
Comment
Altlabel	hasCharacterizationEnvironment
Label	hasCharacterisationEnvironment
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasCharacterisationEnvironmentProperty

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationEnvironmentProperty
Annotations
Preflabel	hasCharacterisationEnvironmentProperty
Comment
Altlabel	hasCharacterizationEnvironmentProperty
Label	hasCharacterisationEnvironmentProperty
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasCharacterisationInput

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationInput
Annotations
Preflabel	hasCharacterisationInput
Comment
Altlabel	hasCharacterizationInput
Label	hasCharacterisationInput
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasInput

hasCharacterisationMeasurementInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationMeasurementInstrument
Annotations
Preflabel	hasCharacterisationMeasurementInstrument
Comment
Altlabel	hasCharacterizationMeasurementInstrument
Label	hasCharacterisationMeasurementInstrument
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasCharacterisationOutput

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationOutput
Annotations
Preflabel	hasCharacterisationOutput
Comment
Altlabel	hasCharacterizationOutput
Label	hasCharacterisationOutput
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasOutput

hasCharacterisationProcedureValidation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationProcedureValidation
Annotations
Preflabel	hasCharacterisationProcedureValidation
Comment
Label	hasCharacterisationProcedureValidation
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasCharacterisationProperty

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationProperty
Annotations
Preflabel	hasCharacterisationProperty
Comment
Altlabel	hasCharacterizationProperty
Label	hasCharacterisationProperty
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasMeasuredProperty

hasCharacterisationSoftware

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationSoftware
Annotations
Preflabel	hasCharacterisationSoftware
Comment
Altlabel	hasCharacterizationSoftware
Label	hasCharacterisationSoftware
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasCharacterisationTask

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasCharacterisationTask
Annotations
Preflabel	hasCharacterisationTask
Comment
Altlabel	hasCharacterizationTask
Label	hasCharacterisationTask
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTask

hasDataAcquisitionRate

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataAcquisitionRate
Annotations
Preflabel	hasDataAcquisitionRate
Comment
Label	hasDataAcquisitionRate
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasDataProcessingThroughCalibration

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataProcessingThroughCalibration
Annotations
Preflabel	hasDataProcessingThroughCalibration
Comment
Label	hasDataProcessingThroughCalibration
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasDataQuality

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataQuality
Annotations
Preflabel	hasDataQuality
Comment
Label	hasDataQuality
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasDataset

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasDataset
Annotations
Preflabel	hasDataset
Comment
Label	hasDataset
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasSign

hasDateOfCalibration

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo/hasDateOfCalibration
Annotations
Preflabel	hasDateOfCalibration
Comment
Label	hasDateOfCalibration
Formal description
Subclass Of	DatatypeProperty
Subclass Of	topDataProperty

hasEndCharacterisationTask

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasEndCharacterisationTask
Annotations
Preflabel	hasEndCharacterisationTask
Comment
Altlabel	hasEndCharacterizationTask
Label	hasEndCharacterisationTask
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasEndTask

hasHardwareSpecification

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasHardwareSpecification
Annotations
Preflabel	hasHardwareSpecification
Comment
Label	hasHardwareSpecification
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasHazard

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasHazard
Annotations
Preflabel	hasHazard
Comment
Label	hasHazard
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasHolder

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasHolder
Annotations
Preflabel	hasHolder
Comment
Label	hasHolder
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasInstrumentForCalibration

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInstrumentForCalibration
Annotations
Preflabel	hasInstrumentForCalibration
Comment
Label	hasInstrumentForCalibration
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasInteractionVolume

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInteractionVolume
Annotations
Preflabel	hasInteractionVolume
Comment
Label	hasInteractionVolume
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasParticipant

hasInteractionWithProbe

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInteractionWithProbe
Annotations
Preflabel	hasInteractionWithProbe
Comment
Label	hasInteractionWithProbe
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasParticipant

hasInteractionWithSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasInteractionWithSample
Annotations
Preflabel	hasInteractionWithSample
Comment
Label	hasInteractionWithSample
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasLab

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasLab
Annotations
Preflabel	hasLab
Comment
Label	hasLab
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasLevelOfAutomation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasLevelOfAutomation
Annotations
Preflabel	hasLevelOfAutomation
Comment
Label	hasLevelOfAutomation
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasManufacturer

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasManufacturer
Annotations
Preflabel	hasManufacturer
Elucidation	A string representing the Manufacturer of a CharacterisationHardware
Comment	A string representing the Manufacturer of a CharacterisationHardware
Label	hasManufacturer
Formal description
Subclass Of	DatatypeProperty
Subclass Of	topDataProperty

hasMeasurementDetector

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementDetector
Annotations
Preflabel	hasMeasurementDetector
Comment
Label	hasMeasurementDetector
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasMeasurementParameter

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementParameter
Annotations
Preflabel	hasMeasurementParameter
Comment
Label	hasMeasurementParameter
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasInput

hasMeasurementProbe

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementProbe
Annotations
Preflabel	hasMeasurementProbe
Comment
Label	hasMeasurementProbe
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasMeasurementSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementSample
Annotations
Preflabel	hasMeasurementSample
Comment
Label	hasMeasurementSample
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasMeasurementTime

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasMeasurementTime
Annotations
Preflabel	hasMeasurementTime
Comment
Label	hasMeasurementTime
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasModel

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasModel
Annotations
Preflabel	hasModel
Elucidation	A string representing the model of a CharacterisationHardware
Comment	A string representing the model of a CharacterisationHardware
Label	hasModel
Formal description
Subclass Of	DatatypeProperty
Subclass Of	topDataProperty

hasOperator

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasOperator
Annotations
Preflabel	hasOperator
Comment
Label	hasOperator
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasAgent

hasPeerReviewedArticle

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPeerReviewedArticle
Annotations
Preflabel	hasPeerReviewedArticle
Comment
Label	hasPeerReviewedArticle
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasConvention

hasPhysicsOfInteraction

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPhysicsOfInteraction
Annotations
Preflabel	hasPhysicsOfInteraction
Comment
Label	hasPhysicsOfInteraction
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasModel

hasPostProcessingModel

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasPostProcessingModel
Annotations
Preflabel	hasPostProcessingModel
Comment
Label	hasPostProcessingModel
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasProcessingReproducibility

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasProcessingReproducibility
Annotations
Preflabel	hasProcessingReproducibility
Comment
Label	hasProcessingReproducibility
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty

hasReferenceSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasReferenceSample
Annotations
Preflabel	hasReferenceSample
Comment
Label	hasReferenceSample
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasSampleBeforeSamplePreparation

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleForPreparation
Annotations
Preflabel	hasSampleBeforeSamplePreparation
Comment
Label	hasSampleBeforeSamplePreparation
Label	hasSampleForPreparation
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasSampleForInspection

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleForInspection
Annotations
Preflabel	hasSampleForInspection
Comment
Label	hasSampleForInspection
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasSampleInspectionInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleInspectionInstrument
Annotations
Preflabel	hasSampleInspectionInstrument
Comment
Label	hasSampleInspectionInstrument
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasSampleInspectionParameter

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampleInspectionParameter
Annotations
Preflabel	hasSampleInspectionParameter
Comment
Label	hasSampleInspectionParameter
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasInput

hasSamplePreparationInstrument

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSamplePreparationInstrument
Annotations
Preflabel	hasSamplePreparationInstrument
Comment
Label	hasSamplePreparationInstrument
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasTemporaryParticipant

hasSamplePreparationParameter

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSamplePreparationParameter
Annotations
Preflabel	hasSamplePreparationParameter
Comment
Label	hasSamplePreparationParameter
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasInput

hasSampledSample

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasSampledSample
Annotations
Preflabel	hasSampledSample
Comment
Label	hasSampledSample
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasOutput

hasUniqueID

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#hasUniqueID
Annotations
Preflabel	hasUniqueID
Elucidation	A string representing the UniqueID of a CharacterisationHardware
Comment	A string representing the UniqueID of a CharacterisationHardware
Label	hasUniqueID
Formal description
Subclass Of	DatatypeProperty
Subclass Of	topDataProperty

rationaleHasCharacterisationProcedure

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#rationaleHasCharacterisationProcedure
Annotations
Formal description
Subclass Of	ObjectProperty
Subclass Of	topObjectProperty

rationaleHasUserCase

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#rationaleHasUserCase
Annotations
Formal description
Subclass Of	ObjectProperty

requiresLevelOfExpertise

Iri	https://w3id.org/emmo/domain/characterisation-methodology/chameo#requiresLevelOfExpertise
Annotations
Preflabel	requiresLevelOfExpertise
Comment
Label	requiresLevelOfExpertise
Formal description
Subclass Of	ObjectProperty
Subclass Of	hasProperty